Die folgenden Begriffe wurden einbezogen:
Leitfähigkeit, conductivity, conductance, 伝導率
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2017,
Rittong B, Sirisumrannukul S
2017 14th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Phuket, Thailand. IEEE: 361-364; ISBN 978-1-5386-0450-2
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2017,
Beiu C, Toader C, Golovanov N, Buica G
2017 International Conference on Electromechanical and Power Systems (SIELMEN), Iasi, Romania. IEEE: 179-183; ISBN 978-1-5386-1847-9
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2017,
Kisel NN, Cheremisov VA, Kisel DV
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: 3433-3438; ISBN 978-1-5090-6270-6
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2017,
Smolyanskaya OA, Odlyanitskiy EL, Chivilikchin SA, Schelkanova IJ, Kozlov SA
2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun, Mexico. IEEE, Cancun, Mexico: 1-2; ISBN 978-1-5090-6050-4
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2017,
El Amrani L, Mazri T, Hmina N
2017 9th International Conference on Electronics, Computers and Artificial Intelligence (ECAI), Targoviste, Romania. IEEE: 1-5; ISBN 978-1-5090-6459-5
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2017,
Campi T, Cruciani S, De Santis V, Maradei F, Feliziani M
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Angers. IEEE, Angers, France: 1-6; ISBN 978-1-5386-0689-6
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2017,
Pabst O, Tronstad C, Martinsen OG
2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: 1844-1848; ISBN 978-1-5090-2810-8
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2016,
Mohd Yusof MS, Supriyanto E, Dewi DEO
2016 International Conference on Robotics, Automation and Sciences (ICORAS), Melaka, Malaysia. IEEE; ISBN 978-1-5090-6206-5
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2016,
Amon NR, Mahbub I, Saha PK
2016 3rd International Conference on Electrical Engineering and Information Communication Technology (ICEEICT), Dhaka, Bangladesh. IEEE; ISBN 978-1-5090-2907-5
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2016,
Wenger C, Bomzon Z, Salvador R, Basser PJ, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5664-5667; ISBN 978-1-4577-0220-4