Die folgenden Begriffe wurden einbezogen:
Proband, Versuchsperson, Testperson, "test person", subject, 被験者
-
2023,
Dolnik B, Dolníková E, Lumnitzer E, Jurgovská E, Liptai P, Šárpataky L
2023 33rd International Conference Radioelektronika (RADIOELEKTRONIKA), Pardubice, Czech Republic. IEEE: 1-5; ISBN 9798350398359
-
2023,
Hasan NI, Wang D, Gomez LJ
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.02.08.527758
-
2022,
Al-Dulamey QK, Hassoon Oraibi A, Al-Salihi A
2022 2nd International Conference on Advances in Engineering Science and Technology (AEST), Babil, Iraq. IEEE: 23-28; ISBN 9798350334913
-
2022,
Andrews D, Blackhurst EJ, Salmon NA
Buller GS, Hollins RC, Lamb RA, Laurenzis M (Hrsg.): Emerging Imaging and Sensing Technologies for Security and Defence VII. Proceedings of SPIE, Band 12274; SPIE, Bellingham; 122740K
-
2022,
Asok AO, Vidhya JS, Babu FB, Dey S, Kunju N
2022 IEEE 19th India Council International Conference (INDICON), Kochi, India. IEEE: 1-4; ISBN 978-1-6654-5272-4
-
2022,
Pustake S, Upadhyaya V, Bundele M
2022 IEEE Pune Section International Conference (PuneCon), Pune, India. IEEE: 1-7; ISBN 978-1-6654-9898-2
-
2022,
Vilagosh Z, Appadoo D, Perera PGT, Nguyen THP, Linklater D, Juodkazis S, Croft R, Ivanova E
2022 7th International Conference on Intelligent Informatics and Biomedical Science (ICIIBMS), Nara, Japan. IEEE: 367-369; ISBN 978-1-6654-8230-1
-
2022,
Tikhomirov A, Kapravchuk V, Briko A, Malakhov A, Kobelev A, Hammoud A
2022 Ural-Siberian Conference on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russian Federation. IEEE: 82-85; ISBN 978-1-6654-6093-4
-
2022,
Zhong X, Jiang H, Jiles DC, Wang Z, Li J, Song B
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Glasgow, Scotland, United Kingdom. IEEE: 3939-3942; ISBN 978-1-7281-2783-5
-
2022,
Ammar AM, Ellafi AY, Zerek AR
2022 IEEE 2nd International Maghreb Meeting of the Conference on Sciences and Techniques of Automatic Control and Computer Engineering (MI-STA), Sabratha, Libya. IEEE: 458-464; ISBN 978-1-6654-7919-6