Die folgenden Begriffe wurden einbezogen:
Zelllinie, "cell line", 細胞株
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Turksen K (Hrsg.): Cell Biology and Translational Medicine, Volume 7. Advances in Experimental Medicine and Biology, Band 1237; Springer, New York; 135-149; ISBN 978-3-030-37844-8
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2019,
Lin YY, Wu T, Liu JY, Gao P, Li KC, Guo QY, Lang HY, Yuan M, Zeng LH, Guo GZ
2019 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Nanjing, China. IEEE: 1-2; ISBN 978-1-5386-7396-6
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2019,
Guo L, Xue YZ, Lin JJ, An GZ, Zhang JP, Zhang KY, He W, Wang H, Li W, Ding GR
2019 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Nanjing, China. IEEE: 1-4; ISBN 978-1-5386-7396-6
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2018,
Le Renard PE, Nimmervoll B, Fellner F, Oppelt P
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Kaszuba-Zwoinska J, Nowak B, Guzdek P, Gil K
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Dong F, Liu Z, Zhang J, Fang J, Guo J, Zhang J, Fang J, Zhang Y
2017 IEEE International Conference on Plasma Science (ICOPS), Atlantic City, NJ, USA. IEEE: 1; ISBN 978-1-5090-5244-8
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2018,
Gurhan H, Bruzón R, Xiong Y, Barnes F
2018 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 1-2; ISBN 978-1-5386-5031-8
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2018,
Cantu JC, Peralta XG, Cerna CZ, Echchzadda I
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan. 11. Auflage; IEEE: 1-2; ISBN 978-1-5386-3810-1
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2018,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong YC
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 872-874; ISBN 978-1-5090-3955-5
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2017,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong R
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Seoul, Korea (South). IEEE; ISBN 978-1-5386-3913-9