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2019,
van Opstal AJ, Kasap B
Ramat S, Shaikh AG (Hrsg.): Mathematical Modelling in Motor Neuroscience: State of the Art and Translation to the Clinic. Gaze Orienting Mechanisms and Disease. Progress in Brain Research, Band 249; Elsevier, Amsterdam; 153-166; ISBN 978-0-444-64254-7
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2019,
Dadarlat MC, Sun Y, Stryker MP
2019 9th International IEEE/EMBS Conference on Neural Engineering (NER), San Francisco, CA, USA. IEEE: 1113-1117; ISBN 978-1-5386-7922-7
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2019,
He Y, Liu S, Guo D, Liu X, Ke Y, Song X, He F, Ming D
2019 9th International IEEE/EMBS Conference on Neural Engineering (NER), San Francisco, CA, USA. IEEE: 93-96; ISBN 978-1-5386-7922-7
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2018,
Beygi M, Mumcu G, Saddow SE
SoutheastCon 2018, St. Petersburg, FL, USA. IEEE: 1-2; ISBN 978-1-5386-6134-5
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2018,
Manoufali M, Abbosh A
2018 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, Boston, MA, USA. IEEE: 215-216; ISBN 978-1-5386-7103-0
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2018,
Brunton E, Silveira C, Riddell J, Nazarpour K
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 1214-1217; ISBN 978-1-5386-3647-3
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2018,
Huang Y, Thomas C, Datta A, Parra LC
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3545-3548; ISBN 978-1-5386-3647-3
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2018,
Zhao Y, Lai JJ, Wu XY, Qu W, Wang MQ, Chen L, Hu N, Wang X, Hou WS
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2240-2243; ISBN 978-1-5386-3647-3
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2018,
Boyer A, Duffau H, Vincent M, Ramdani S, Mandonnet E, Guiraud D, Bonnetblanc F
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2210-2213; ISBN 978-1-5386-3647-3
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2018,
Tarnaud T, Tanghe E, Haesler S, Lopez CM, Martens L, Joseph W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2166-2169; ISBN 978-1-5386-3647-3