Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2019,
Ji X, Zheng J, Chen J
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: S. 527-528; ISBN 978-1-7281-0693-9
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2019,
Mao C, Werner PL, Werner DH, Vital D, Bhardwaj S
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: S. 1555-1556; ISBN 978-1-7281-0693-9
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2019,
Phaneuf M, Mojabi P
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: S. 533-534; ISBN 978-1-7281-0693-9
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2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: S. 166-169; ISBN 978-1-7281-1639-6
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2019,
Ahmed S, Mehmood A, Sydänheimo L, Ukkonen L, Björninen T
2019 IEEE International Conference on RFID Technology and Applications (RFID-TA), Pisa, Italy. IEEE: S. 231-235; ISBN 978-1-7281-0590-1
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2019,
Sistani S, Fatemi I, Shafeie SA, Kaeidi A, Azin M, Shamsizadeh A
Somatosens Mot Res 36 (4): 292-297
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2019,
Basikolo T, Yoshida T, Sakurai M
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: S. 1523-1524; ISBN 978-1-7281-0693-9
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IEEE Access 7: 162062 - 162069
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2019,
Cavagnaro M, Pinto R, Lopresto V
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: S. 538-541; ISBN 978-1-7281-1240-4
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2019,
Paffi A, Banin A, Denzi A, Casciola M, Liberti M, Apollonio F
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: S. 639-642; ISBN 978-1-7281-1240-4