Die folgenden Begriffe wurden einbezogen:
transkraniell, transcranial, 経頭蓋
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2021,
Hosseini-Fahraji A, Manteghi M
2021 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (APS/URSI), Singapore. IEEE: S. 613-614; ISBN 978-1-7281-4671-3
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2021,
Yosef RA, Toaha Mobashsher A
2021 IEEE Asia-Pacific Microwave Conference (APMC), Brisbane, Australia. IEEE: S. 70-72; ISBN 978-1-6654-3783-7
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2021,
Afuwape OF, Kiarie WM, Bentil SA, Jiles DC
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 1504-1507; ISBN 978-1-7281-1179-7
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2021,
Vergara VM, Rafiei F, Wokke ME, Lau H, Rahnev D, Calhoun VD
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 1407-1411; ISBN 978-1-7281-1179-7
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2021,
Wendt K, Sorkhabi MM, O'Shea J, Cagnan H, Denison T
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 6058-6061; ISBN 978-1-7281-1179-7
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2021,
Jia T, Mo L, Li C, Liu A, Li Z, Ji L
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 6116-6120; ISBN 978-1-7281-1179-7
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2021,
Daneshzand M, Makarov SN, de Lara LIN, Nummenmaa A
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 1301-1304; ISBN 978-1-7281-1179-7
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2021,
Afuwape OF, Runge J, Bentil SA, Jiles DC
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 1535-1538; ISBN 978-1-7281-1179-7
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2021,
Jiang W, Isenhart R, Kistler N, Lu Z, Xu H, Lee DJ, Liu CY, Song D
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 6318-6321; ISBN 978-1-7281-1179-7
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2021,
Zaidi TA, Makarov SN, Fujimoto K
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 6565-6568; ISBN 978-1-7281-1179-7