[1.2 T垂直スキャナーvs.1.5 T水平システムでのMRI中の脳深部刺激インプラントのRF加熱:現実的なリード構成でのシミュレーション研究] dev./impl.

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掲載誌: 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Montreal, QC, Canada. IEEE, 2020: 6143-6146; ISBN 978-1-7281-1991-5

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