[誘導、高周波およびマイクロ波近傍界におけるSAR値の研究] tech./dosim.

A Study of SAR Values in Induction, High Frequency and Microwave Nearfields.

掲載誌: 著者のリストなし, 2020 23rd International Microwave and Radar Conference (MIKON), Warsaw, Poland IEEE, 2020: 386-391, ISBN 9781728157870

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