[誘導、高周波およびマイクロ波近傍界におけるSAR値の研究] tech./dosim.

A Study of SAR Values in Induction, High Frequency and Microwave Nearfields

掲載誌: 2020 23rd International Microwave and Radar Conference (MIKON), Warsaw, Poland. IEEE, 2020: 386-391; ISBN 978-1-7281-5787-0

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