-
2010,
Dughiero F, Forzan M, Sieni E
Compel - Int J Comp Math Electr Electron Eng 29 (6): 1552-1561
-
2010,
Scorretti R, Perrussel R, Morel L, Burais N, Nicolas L
Compel - Int J Comp Math Electr Electron Eng 29 (6): 1425-1435
-
J Risk Res 13 (5): 621-637
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 50364 VDE 0848-364:2010-11
-
2010,
Dawes DM, Ho JD, Reardon RF, Miner JR
Forensic Sci Med Pathol 6 (4): 268-274
-
2010,
Dawes DM, Ho JD, Cole JB, Reardon RF, Lundin EJ, Terwey KS, Falvey DG, Miner JR
Acad Emerg Med 17 (4): 436-443
-
2010,
Mi Y, Yao C, Li C, Sun C, Tang J, Yang F, Wen Y
IEEE Trans Plasma Sci 38 (8): 1963-1971
-
2010,
TNS Opinion & Social
European Commission,
Report, Eurobarometer 347, Wave 73.3: 1-101
-
2010,
Liu D, Wang H, Li SX, Ma XT, Duan YJ, Zhou HY, Zhou YW
Fa Yi Xue Za Zhi 26 (6): 421-424
-
2010,
Fang HH, Zeng GY, Nie Q, Kang JB, Ren DQ, Zhou JX, Li YM
Zhonghua Yi Xue Za Zhi 90 (45): 3231-3234