-
2022,
Fernández M, Peña I, Gil U, Jurado U, Guerra D
2022 IEEE International Symposium on Broadband Multimedia Systems and Broadcasting (BMSB), Bilbao, Spain. IEEE: 1-6; ISBN 978-1-6654-6902-9
-
2022,
Djuric N, Kljajic D, Otasevic V, Djuric S
2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), Trento, Italy. IEEE: 433-438; ISBN 978-1-6654-1094-6
-
2022,
Sobkowska D, Gornowicz-Porowska J, Seraszek-Jaros A, Słomińska D, Adamski Z, Pawlaczyk M
Clin Cosmet Investig Dermatol 15: 1347-1355
-
2022,
Seetharaman R, Tharun M, Gayathri S, Sreeja Mole SS, Anandan K
Mater Today Proc 51: 2365-2374
-
2022,
Adda S, Aureli T, Coltellacci S, D’elia S, Franci D, Grillo E, Pasquino N, Pavoncello S, Suman R, Vaccarono M
2022 IEEE International Workshop on Metrology for Living Environment (MetroLivEn), Cosenza, Italy. IEEE: 258-262; ISBN 978-1-6654-0894-3
-
2022,
Amato L, Romeo S, Izzi F, La Scaleia G, Alonzo M, Salvia V, Maio D, Zeni O, Soldovieri F, Lapenna V
2022 Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy. IEEE: 1-4; ISBN 978-1-6654-7111-4
-
Environ Res 214 Pt 2: 113851
-
2022,
Huang Y, Li H, Hu T, Li J, Yiu CK, Zhou J, Li J, Huang X, Yao K, Qiu X, Zhou Y, Li D, Zhang B, Shi R, Liu Y, Wong TH, Wu M, Jia H, Gao Z, Zhang Z, He J, Zheng M, Song E, Wang L, Xu C, Yu X
Nano Lett 22 (14): 5944-5953
-
2022,
Fujita Y, Khoo HM, Hirayama M, Kawahara M, Koyama Y, Tarewaki H, Arisawa A, Yanagisawa T, Tani N, Oshino S, Lemieux L, Kishima H
Front Neurosci 16: 921922
-
2022,
Horikoshi S, Iwabuchi M, Kawaguchi M, Yasumasu S, Serpone N
Photochem Photobiol Sci 21 (10): 1819-1831