-
2023,
Samoilescu G, Bordianu A
[船舶上での電磁放射の分析]
[tech./dosim.]
2023 10th International Conference on Modern Power Systems (MPS), Cluj-Napoca, Romania. IEEE: 1-4; ISBN 9798350326833
-
2023 10th International Conference on Modern Power Systems (MPS), Cluj-Napoca, Romania. IEEE: 01-05; ISBN 9798350326833
-
2023 IEEE IAS Electrical Safety Workshop (ESW), Reno, NV, USA. IEEE: 1-5; ISBN 9798350398250
-
2023,
Skurčák L, Pavlov L, Bojda P, Gbelec J
2023 14th International Conference on Measurement, Smolenice, Slovakia. IEEE: 187-190; ISBN 9798350312188
-
2023 IEEE International Symposium on Product Compliance Engineering (ISPCE), Dallas, TX, USA. IEEE: 1-6; ISBN 978-1-6654-5679-1
-
2023 IEEE International Symposium on Product Compliance Engineering (ISPCE), Dallas, TX, USA. IEEE: 1-5; ISBN 978-1-6654-5679-1
-
2023,
Souček T, Richter A, Morava J, Slavík L
2023 5th International Congress on Human-Computer Interaction, Optimization and Robotic Applications (HORA), Istanbul, Turkiye. IEEE: 1-4; ISBN 9798350337532
-
2023,
Lamkitja S, Tarateeraseth V
2023 20th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Nakhon Phanom, Thailand. IEEE: 1-4; ISBN 9798350310474
-
2023,
Saha R, Goyal A, Yuen J, Oh Y, Bloom RP, Benally OJ, Wu K, Netoff TI, Low WC, Bennet KE, Lee KH, Shin H, Wang JP
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.05.25.542334
-
2023,
Gao Y, Qi D, Li C, Zhao H
2023 4th International Conference on Computer Engineering and Application (ICCEA), Hangzhou, China. IEEE: 56-60; ISBN 9798350347555
-
2023,
Rodionov A, Ozdemir RA, Benwell CSY, Fried PJ, Boucher P, Momi D, Ross JM, Santarnecchi E, Pascual-Leone A, Shafi MM
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.05.12.540024
-
2023,
Hawthorne C, Harrison D, McEvoy E, Lopez Campos G
Hägglund M, Blusi M, Bonacina S, Nilsson L, Madsen IC, Pelayo S, Moen A, Benis A, Lindsköld L, Gallos P (eds.): Caring is Sharing – Exploiting the Value in Data for Health and Innovation. Studies in Health Technology and Informatics, 302巻; IOS Press, Amsterdam; 1069-1070; ISBN 978-1-64368-388-1
-
2023,
Costea M, Leonida T
2023 13th International Symposium on Advanced Topics in Electrical Engineering (ATEE), Bucharest, Romania. IEEE: 1-6; ISBN 9798350331943
-
Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.7-2022: 1-139, ISBN 978-1-5044-9390-1
-
2022,
Ramirez-Bettoni E, Nemeth B
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: 1-9; ISBN 978-1-6654-7864-9
-
2022,
Li Y, Liu D, Zhang J, Wu L
2022 International Conference on Mechanical and Electronics Engineering (ICMEE), Xi'an, China. IEEE: 162-166; ISBN 978-1-6654-9221-8
-
2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
-
2022,
Liu Z, Hao W, Huang R
2022 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS), Dalian, China. IEEE: 1157-1162; ISBN 978-1-6654-7054-4
-
2022,
Ivanova M, Barudov E
2022 14th Electrical Engineering Faculty Conference (BulEF), Varna, Bulgaria. IEEE: 1-4; ISBN 978-1-6654-9027-6
-
2022,
Badwey MA, Abbasy NH, Eldallal GM
2022 23rd International Middle East Power Systems Conference (MEPCON), Cairo, Egypt. IEEE: 1-8; ISBN 978-1-6654-6364-5
-
2022,
Emhemmed AS, Abougarair AJ, Salih O, Alsamlqi SS
2022 IEEE 21st international Ccnference on Sciences and Techniques of Automatic Control and Computer Engineering (STA), Sousse, Tunisia. IEEE: 18-23; ISBN 978-1-6654-8262-2
-
2022,
Boukabou I, Foust L, Benouadah S, Rupanetti D, Wolf J, Kaabouch N
2022 North American Power Symposium (NAPS), Salt Lake City, UT, USA. IEEE: 1-6; ISBN 978-1-6654-9922-4
-
2022,
Kim D, Kim M, Lee S, Lee Y, Kim Y
2022 9th International Conference on Condition Monitoring and Diagnosis (CMD), Kitakyushu, Japan. IEEE: 687-690; ISBN 978-1-6654-7015-5
-
2022 IEEE ANDESCON, Barranquilla, Colombia. IEEE: 1-7; ISBN 978-1-6654-8855-6
-
2022,
Nourredine T, Rabah D, Abdechafik H
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: 1813-1819; ISBN 978-1-6654-7109-1