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2022 IEEE ANDESCON, Barranquilla, Colombia. IEEE: pp. 1-7; ISBN 978-1-6654-8855-6
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2022,
Nourredine T, Rabah D, Abdechafik H
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: pp. 1813-1819; ISBN 978-1-6654-7109-1
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2022,
Glyva V, Levchenko L, Auscheva N, Tykhenko O
2022 IEEE 8th International Conference on Energy Smart Systems (ESS), Kyiv, Ukraine. IEEE: pp. 288-291; ISBN 9798350334425
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2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: pp. 1-4; ISBN 978-1-6654-0751-9
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2022,
Houicher SE, Djekidel R, Bessedik SA
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: pp. 1825-1830; ISBN 978-1-6654-7109-1
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2022,
Vornicu S, Lunca E, Neagu BC, Baiceanu FC
2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 723-726; ISBN 978-1-6654-8995-9
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2022,
Pavel I, David V, Roman MG, Bordas AM
2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 484-488; ISBN 978-1-6654-8995-9
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2022,
Eblen ML, Ramirez-Bettoni E, Wallace K
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: pp. 1-7; ISBN 978-1-6654-7864-9
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2022,
Zablodskiy M, Pliuhin V, Kucheruk P
2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE: pp. 391-396; ISBN 978-1-6654-6923-4
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2022,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2022:16: 1-100