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5429件の論文が見つかりました。

キーワード: "Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会

• 2024, Yu C, Yang S, Han Y, Jin L, Chen Y, Wang W, Li Z, Zhang L, Zheng Y
  [低帯域でLHCP、高帯域でRHCPを特徴とする産業用IoTアプリケーション向けヘルメット適合AMCを備えたDBDCPアンテナ] [tech./dosim.]
  IEEE Internet Things J [in press]
• 2024, Khan MA, Sethi WT, Malik WA, Jabbar A, Khalid MA, Almuhlafi AM, Himdi M
  [WBANアプリケーション用の低プロファイル二重帯域フレキシブル全方向性ウェアラブルアンテナの包括的分析] [tech./dosim.]
  IEEE Access 12: 45187-45201
• 2024, Singh N, Khan T, Kumar S, Kanaujia BK, Choi HC, Kim KW, Rambabu K, Rengarajan SR, Kishk AA
  [スマートウォッチ／リストバンドのワイヤレス電力ハーベスティング／充電用の電力管理ユニットと統合型超薄型フレキシブルレクテナ] [tech./dosim.]
  Sci Rep 14: 7447
• 2024, Chen C, Guo Z, Peng W, Wang S, Qiu S, Zhang J, Chen X, He H
  [連続シータバースト刺激の直接的および短期的効果の動的脳状態における追跡] [med. app.]
  IEEE Trans Neural Syst Rehabil Eng 32: 1386-1396
• 2024, Alshammari A, Iqbal A, Basir A, Simorangkir RBVB, Mabrouk IB
  Ultra-Miniaturized Dual-Band Implantable Antenna for Wireless Capsule Endoscopy [tech./dosim.]
  IEEE Sens J [in press]
• 2024, Elmashtoly MH, Gouda OE, Lehtonen M, Darwish MMF
  Mitigation of the electric field under EHVTL in limited space crowded with human activities [tech./dosim.]
  IEEE Access 12: 41009-41018
• 2024, Yao M, Pedersen GF, Zhang S
  Investigation of Criterion for Applying Incident Power Density in the Near-Field Region for EMF Assessment at Quasi-Millimeter and Millimeter-Wave Frequencies [tech./dosim.]
  IEEE Trans Electromagn Compat [in press]
• 2024, Elsheakh DN, Fahmy OM, Farouk M, Ezzat K, Eldamak AR
  An Early Breast Cancer Detection by Using Wearable Flexible Sensors and Artificial Intelligent [tech./dosim.]
  IEEE Access [in press]
• 2024, Kaur G, Saurav K, Dubey SC
  1×2 Pentagonal Patch Antenna Array Based Pancreatic Cancer Detection [tech./dosim.]
  2024 IEEE Applied Sensing Conference (APSCON), Goa, India. IEEE: 1-4; ISBN 9798350317282
• 2024, Mallik M, Allaert B, Egea-Lopez E, Gaillot DP, Wiart J, Clavier L
  EME-CNTK: Infinite Limits of Convolutional Neural Network for Urban Electromagnetic Field Exposure Reconstruction [tech./dosim.]
  IEEE Access 12: 49476-49488