キーワード:
"attention deficit hyperactivity disorder", Aufmerksamkeitsdefizit-Hyperaktivitätssyndrom, Aufmerksamkeitsdefizit-Syndrom, ADHS, ADS, "attention deficit disorder", ADHD, ADD, 注意欠陥多動性障害, 注意欠陥障害
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2021,
Chountala C, Chareau JM, Chawdhry P
2021 IEEE 4th 5G World Forum (5GWF), Montreal, QC, Canada. IEEE: pp. 275-280; ISBN 978-1-6654-4309-8
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2021,
Santos FH, Mosbacher JA, Menghini D, Rubia K, Grabner RH, Cohen Kadosh R
Cohen Kadosh R, Zaehle T, Krauel K (eds.): Non-invasive Brain Stimulation (NIBS) in Neurodevelopmental Disorders. Progress in Brain Research, 264巻; Elsevier, Amsterdam; pp. 1-40; ISBN 978-0-12-822344-4
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2021 6th International Conference for Convergence in Technology (I2CT), Maharashtra, India. IEEE: pp. 1-6; ISBN 978-1-7281-8877-5
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2021,
Alhuwaidi S, Rashid T
2020 International Conference on Communications, Signal Processing, and their Applications (ICCSPA), Sharjah, United Arab Emirates. IEEE: pp. 1-6; ISBN 978-1-7281-6536-3
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2020,
Pang K, Liu Z, Liu Y, Lv X
2020 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Shanghai, China. IEEE: pp. 1-3; ISBN 978-1-7281-5734-4
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2020,
Rosu G, Tuta L, Halca A, Bicheru S, Hertzog R, Baltag O
2020 13th International Conference on Communications (COMM), Bucharest, Romania. IEEE: pp. 451-456; ISBN 978-1-7281-5612-5
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2019,
Mohd Hussin EFN, Soh PJ, Jamlos MF, Lago H, Al-Hadi AA, Abdullahi Q, Anagnostou DE, Podilchak SK
2019 13th European Conference on Antennas and Propagation (EuCAP), Krakow, Poland. IEEE: pp. 1-4; ISBN 978-1-5386-8127-5
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2019,
Small AT, Dougherty ET
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: pp. 2340-2343; ISBN 978-1-5386-1312-2
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2019,
Frigura-Iliasa M, Olariu AF, Baloi FI, Frigura-Iliasa FM, Vatau D, Petrenci RC
2019 International Conference on ENERGY and ENVIRONMENT (CIEM), Timisoara, Romania. IEEE: pp. 82-85; ISBN 978-1-7281-1533-7
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2018,
Sun X, Lu L, Liu X, Chen W
2018 IEEE Nuclear Science Symposium and Medical Imaging Conference Proceedings (NSS/MIC), Sydney, NSW, Australia. IEEE: pp. 1-4; ISBN 978-1-5386-8495-5