キーワード:
"electronic article surveillance", "Elektronische Artikelsicherung", Warensicherungssystem, EAS, "electronic security surveillance", "anti-theft device", 電子式物品監視装置, 盗難防止装置
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2019,
Andrenko AS, Shimizu Y, Wake K
2019 IEEE International Conference on RFID Technology and Applications (RFID-TA), Pisa, Italy. IEEE: 297-300; ISBN 978-1-7281-0590-1
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2018,
Herrala M, Kumari K, Blomme A, Khan MW, Koivisto H, Naarala J, Roivainen P, Tanila H, Viluksela M, Juutilainen J
Eskola H, Väisänen O, Viik J, Hyttinen J (eds.): EMBEC & NBC 2017: Joint Conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 2017. IFMBE Proceedings, 65巻; Springer, Singapore; 719-722; ISBN 978-981-10-5121-0
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2018,
Zradzinski P, Karpowicz J, Gryz G
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2017,
Schmid G, Hirtl R, Schneeweiß P, Jhala T, Sainitzer D
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-92/14: 1-114
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2017,
Jomaa K, Ndagijimana F, Ayad H, Fadlallah M, Jomaah J
2017 IEEE Applied Electromagnetics Conference (AEMC), Aurangabad, India. IEEE; ISBN 978-1-5386-2394-7
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2017,
Jomaa K, Ndagijimana F, Ayad H, Fadlallah M, Jomaah J
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Angers. IEEE, Angers, France; ISBN 978-1-5386-0689-6
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2016,
European Commission, Directorate-General for Health and Consumers
Publications Office of the European Union,
1-288, ISBN 978-92-79-30134-6
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2015,
Hansson Mild K, Sandström M
European Trade Union Institut (ETUI),
1-31, ISBN 978-2-8-7452336-6
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2014,
Kim HS, Lee YH, Choi HD, Lee AK, Lee YS, Pack JK, Kim N, Ahn YH
2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 170-173; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 206-209; ISBN 978-4-88552-287-1