キーワード:
"extrem hohe Frequenz", Millimeterwelle, EHF, "extremely high frequency", "millimeter wave", MMW, 超高周波, ミリ波
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2020,
Lumnitzer R, Tanner A, Elsherbeni AZ
2020 International Applied Computational Electromagnetics Society Symposium (ACES), Monterey, CA, USA. IEEE: 1-2; ISBN 978-1-7281-6285-0
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2020,
Li K, Sasaki K, Wake K, Onishi T, Watanabe S
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Franci D, Coltellacci S, Grillo E, Pavoncello S, Aureli T, Cintoli R, Migliore MD
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Rumeng T, Ying S, Tong W, Wentao Z
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Reno, NV, USA. IEEE: 659-662; ISBN 978-1-7281-7431-0
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2020,
Modenese A, Gobba F
2020 IEEE International Conference on Environment and Electrical Engineering and 2020 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), Madrid, Spain. IEEE: 1-6; ISBN 978-1-7281-7456-3
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2020,
Reboux S, Pfeifer S, Kuster N
2020 14th European Conference on Antennas and Propagation (EuCAP), Copenhagen, Denmark. IEEE: 1-4; ISBN 978-1-7281-3712-4
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2020,
He W, Scialacqua L, Scannavini A, Ying Z, Zhao K, Xu B, Di Paola C, Zhang S, He S
2020 14th European Conference on Antennas and Propagation (EuCAP), Copenhagen, Denmark. IEEE: 1-4; ISBN 978-1-7281-3712-4
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2020,
Marynchenko L, Nizhelska O, Kurylyuk A, Makara V, Naumenko S
2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE: 603-608; ISBN 978-1-7281-9714-2
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2020,
Shandilya H, Balaji A, Reddy GR
2020 International Conference on Emerging Trends in Information Technology and Engineering (ic-ETITE), Vellore, India. IEEE: 1-5; ISBN 978-1-7281-4143-5
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2019,
Cardoso V, Dinis H, Mendes PM
2019 IEEE 6th Portuguese Meeting on Bioengineering (ENBENG), Lisbon, Portugal. IEEE: 1-4; ISBN 978-1-5386-8507-5