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2016,
van Rhoon GC, Paulides MM, van Holthe JM, Franckena M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 359-362, ISBN 978-1-4577-0220-4
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2016,
Hershkovich HS, Bomzon Z, Wenger C, Urman N, Chaudhry A, Garcia-Carracedo D, Kirson ED, Weinberg U, Wassermann Y, Palti Y
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 2357-2360, ISBN 978-1-4577-0220-4
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2016,
Denzi A, Escobar JA, Nasta C, Merla C, Benassi B, Consales C, Apollonio F, Liberti M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 4189-4192, ISBN 978-1-4577-0220-4
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2016,
Macedo M, Wenger C, Salvador R, Fernandes SR, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5168-5171, ISBN 978-1-4577-0220-4
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2016,
Restrepo AF, Tobar VE, Camargo RJ, Franco E, Pinedo CR, Gutierrez O
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 4193-4196, ISBN 978-1-4577-0220-4
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2016,
Tuğlu MI, Gülbağça F, Sal DH, Sayğili S, Sönmez PK, Aydemi̇r I, Özkut M, Öztürk Ş, Gümüşay M, Kaya A, Keskin N
[細胞の挙動に対する電磁界の影響]
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[2016 20th National Biomedical Engineering Meeting (BIYOMUT), Izmir]. IEEE: ISBN 978-1-5090-5830-3
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2016,
Salam MA, Wen F, Amir Pg, Ang SP, Uddin MR, Rahman QM, Hasan S
2016 IEEE International Conference on Power System Technology (POWERCON), Wollongong, NSW, Australia. IEEE: ISBN 978-1-4673-8849-8
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2016,
Manzanárez A, Lara JE, Vera A, Leija L, Gutiérrez MI
2016 13th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE), Mexico City. IEEE: ISBN 978-1-5090-3512-0
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2016,
Ramirez Martinez CA, Vera Tizatl AL, Vera Tizatl CE, Hernández Rodríguez PR, Vera Hernández A, Leija Salas L, Gutiérrez Velasco MI, Rodríguez Cuevas SA
2016 13th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE), Mexico City. IEEE: ISBN 978-1-5090-3512-0