-
2022,
Sârbu A, Şorecău E, Şorecău M, Miclăuş S, Bechet P
2022 IEEE 9th Electronics System-Integration Technology Conference (ESTC), Sibiu, Romania. IEEE: 597-602; ISBN 978-1-6654-8948-5
-
2022,
Kapetanović AL, Šušnjara A, Poljak D, Russo M
2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: 1-5; ISBN 978-1-6654-7018-6
-
2022,
Galic M, Crnolatec M, Poljak D
2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: 1-6; ISBN 978-1-6654-7018-6
-
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 311-316; ISBN 978-1-6654-0789-2
-
2022,
Adda S, Aureli T, Cassano T, Franci D, Migliore MD, Pasquino N, Pavoncello S, Schettino F, Schirone M
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
-
2022,
Capstick M, Mischa Sabathy, Brönnimann M, Rivara B, Bruno Klopott, Kühn S, Xi J, Choi D, Kuster N
2022 Wireless Power Week (WPW), Bordeaux, France. IEEE: 68-71; ISBN 978-1-6654-8446-6
-
2022 Wireless Power Week (WPW), Bordeaux, France. IEEE: 64-67; ISBN 978-1-6654-8446-6
-
2022,
Li N, Wang Y, Zhang J, Gan Z
2022 IEEE 5th International Electrical and Energy Conference (CIEEC), Nangjing, China. IEEE: 3944-3948; ISBN 978-1-6654-1105-9
-
2022,
Fiocchi S, Chiaramello E, Bonato M, Gallucci S, Benini M, Tognola G, Dossi L, Parazzini M, Ravazzani P
2022 IEEE 21st Mediterranean Electrotechnical Conference (MELECON), Palermo, Italy. IEEE: 1258-1263; ISBN 978-1-6654-4281-7
-
2022,
Ponti C, Schettini G
2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), Trento, Italy. IEEE: 49-53; ISBN 978-1-6654-1094-6
-
2022,
Gallucci S, Bonato M, Benini M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M
2022 Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy. IEEE: 1-4; ISBN 978-1-6654-7111-4
-
2022,
Adda S, Aureli T, Coltellacci S, D’elia S, Franci D, Grillo E, Pasquino N, Pavoncello S, Suman R, Vaccarono M
2022 IEEE International Workshop on Metrology for Living Environment (MetroLivEn), Cosenza, Italy. IEEE: 258-262; ISBN 978-1-6654-0894-3
-
2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC), Gran Canaria, Spain. IEEE: 1-4; ISBN 978-1-6654-9986-6
-
2022,
Xu B, Colombi D, Joshi P, Ghasemifard F, Anguiano Sanjurjo D, Di Paola C, Törnevik C
2022 16th European Conference on Antennas and Propagation (EuCAP), Madrid, Spain. IEEE: 1-5; ISBN 978-1-6654-1604-7
-
2022,
Soares IV, Skrivervik AK, Nikolayev D
2022 16th European Conference on Antennas and Propagation (EuCAP), Madrid, Spain. IEEE: 1-5; ISBN 978-1-6654-1604-7
-
2022,
Jiang T, Skrivervik AK
2022 16th European Conference on Antennas and Propagation (EuCAP), Madrid, Spain. IEEE: 1-5; ISBN 978-1-6654-1604-7
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.91 (01/2022): 1-98
-
2021,
Omi S, Sasaki K, Nagaoka T
2021 IEEE Conference on Antenna Measurements & Applications (CAMA), Antibes Juan-les-Pins, France. IEEE: 22-24; ISBN 978-1-7281-9698-5
-
2021 XXXIVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Rome, Italy. IEEE: 1-2; ISBN 978-1-6654-2995-5
-
2021,
Liu S, Onishi T, Taki M, Ikuyo M, Tobita K, Watanabe S, Suzuki Y
2021 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), Singapore. IEEE: 49-50; ISBN 978-1-6654-4657-0
-
2021,
Ramos V, Marina P, Torres-Ruiz M, Suárez OJ, López V, Liste I, De Alba M
2021 Photonics & Electromagnetics Research Symposium (PIERS), Hangzhou, China. IEEE: 2800-2807; ISBN 978-1-6654-0988-9
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.100 (06/2021): 1-40
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.52 (06/2021): 1-44
-
2021,
Ajibare AT, Ramotsoela D, Akinyemi LA, Oladejo SO
2021 IEEE AFRICON, Arusha, Tanzania, United Republic of. IEEE: 1-6; ISBN 978-1-6654-4748-5
-
2021,
Sârbu A, Miclăuș S, Șorecău E, Bechet P
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Raleigh, NC, USA. IEEE: 243-248; ISBN 978-1-6654-4889-5