キーワード:
心室, "Ventriculus cordis", Herzventrikel, Herzkammer, "cardiac ventricle", "heart ventricle"
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2023,
Campi T, Cruciani S, Maradei F, Feliziani M
2023 IEEE Wireless Power Technology Conference and Expo (WPTCE), San Diego, CA, USA. IEEE: 1-4; ISBN 9798350337389
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2022,
Sá LA, Bortolazzo EMS, Costa Jr JA, de Oliveira PX
Bastos-Filho TF, de Oliveira Caldeira EM, Frizera-Neto A (eds.): XXVII Brazilian Congress on Biomedical Engineering, CBEB 2020. IFMBE Proceedings, 83巻; Springer, Cham; 25-30; ISBN 978-3-030-70600-5
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2021,
Kroll MW, Hisey DAS, Andrews CJ, Perkins PE, Panescu D
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: 1462-1467; ISBN 978-1-7281-1179-7
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2019,
Kroll MW, Panescu D, Hirtler R, Koch M, Andrews CJ
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 1788-1794; ISBN 978-1-5386-1312-2
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2015,
Hashimoto I, Shiba K
2015 IEEE Biomedical Circuits and Systems Conference (BioCAS), Atlanta, GA, USA. IEEE: 1-4; ISBN 978-1-4799-7234-0
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2015,
Mattei E, Censi F, Triventi M, Mancini M, Napolitano A, Genovese E, Cannata V, Falsaperla R, Calcagnini G
2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Milan, Italy. IEEE: 7200-7203; ISBN 978-1-4244-9271-8
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2011,
Walcott GP, Kroll MW, Ideker RE
2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Boston, MA, USA. IEEE: 255-258; ISBN 978-1-4577-1589-1
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2011,
Kroll MW, Lakkireddy D, Rahko PS, Panescu D
2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Boston, MA, USA. IEEE: 271-277; ISBN 978-1-4577-1589-1
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2008,
Panescu D, Kroll MW, Stratbucker RA
2008 30th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Vancouver, BC, Canada. IEEE: 5671-5674; ISBN 978-1-4244-1814-5
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IEEE Systems Technical Conference on Industrial and Commercial Power 2005., Saratoga Springs, NY, USA. IEEE: 154-158; ISBN 978-0-7803-9021-8