キーワード:
潜時, Induktionszeit, Latenzperiode, Latenzzeit, Latenz, "induction period", "induction time", "latent period", "response time", latency, 潜伏期, 誘導期
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2024,
Sousouri G, Eicher C, D’ Angelo RM, Billecocq M, Fussinger T, Studler M, Capstick M, Kuster N, Achermann P, Huber R, Landolt HP
medRxiv: the Preprint Server for Health Sciences (medRxiv),
2024.12.16.24319082
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2024,
Madawalage N, Thalgahagoda T, Gunatilake I, Fernando P, Wijesiri G, Seneviratne C, Liyanage M
2024 IEEE 21st Consumer Communications & Networking Conference (CCNC), Las Vegas, NV, USA. IEEE: pp. 392-395; ISBN 9798350304589
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2023,
Nguyen HC, Dam TH, Le MT, Nguyen QC, Nguyen DD
2023 IEEE 9th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA), Kuala Lumpur, Malaysia. IEEE: pp. 121-126; ISBN 9798350343397
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2023,
Alekhya B, Shabareesh JJRK, Prasad KV, Revanth CVS, Polani P, Swathi D
2023 International Conference on Sustainable Communication Networks and Application (ICSCNA), Theni, India. IEEE: pp. 546-550; ISBN 9798350313994
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2023,
Shrivastava P, Sharma V
2023 4th International Conference on Intelligent Engineering and Management (ICIEM), London, United Kingdom. IEEE: pp. 1-6; ISBN 9798350341133
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2023,
Gogulski J, Cline CC, Ross JM, Parmigiani S, Keller CJ
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.09.04.556283
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2023,
Li K, Mollel MS, Popoola O, Sambo Y, Imran MA
2023 5th International Conference on Computer Communication and the Internet (ICCCI), Fujisawa, Japan. IEEE: pp. 185-189; ISBN 9798350326963
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2023,
Mariam John D, Ali T, Vincent S, Pathan S, Kumar P, Parveez Shariff BG
2023 International Telecommunications Conference (ITC-Egypt), Alexandria, Egypt. IEEE: pp. 23-28; ISBN 9798350326079
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2023,
John DM, Ali T, Vincent S, Pathan S, Kumar P
2023 International Telecommunications Conference (ITC-Egypt), Alexandria, Egypt. IEEE: pp. 29-33; ISBN 9798350326079
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2023,
Nauman A, Jamshed MA, Kim SW
Ur Rehman M, Jamshed MA (eds.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; pp. 151-186; ISBN 978-1-119-90916-3