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2396件の論文が見つかりました。

キーワード: 細胞培養, Zellkultur, "cell culture"

• 2019, Elhalel G, Price C, Fixler D, Shainberg A
  [シューマン共鳴帯域の弱い磁界によるストレス状態からの心臓の保護] [med./bio.]
  Sci Rep 9 (1): 1645
• 2019, Deamici KM, Cuellar-Bermudez SP, Muylaert K, Santos LO, Costa JAV
  Quantum yield alterations due to the static magnetic fields action on Arthrospira platensis SAG 21.99: Evaluation of photosystem activity. [med./bio.]
  Bioresour Technol 292: 121945
• 2019, Sztafrowski D, Suchodolski J, Muraszko J, Sigler K, Krasowska A
  The influence of N and S poles of static magnetic field (SMF) on Candida albicans hyphal formation and antifungal activity of amphotericin B. [med./bio.]
  Folia Microbiol (Praha) 64 (6): 727-734
• 2019, Abasi S, Aggas JR, Venkatesh N, Vallavanatt IG, Guiseppi-Elie A
  Design, fabrication and testing of an electrical cell stimulation and recording apparatus (ECSARA) for cells in electroculture. [tech./dosim.]
  Biosens Bioelectron 147: 111793
• 2019, Jang YW, Gil KC, Lee JS, Kang W, Park SY, Hwang KW
  T-Cell Differentiation to T Helper 9 Phenotype is Elevated by Extremely Low-Frequency Electromagnetic Fields Via Induction of IL-2 Signaling. [med./bio.]
  Bioelectromagnetics 40 (8): 588-601
• 2019, Koohestani NV, Zavareh S, Lashkarbolouki T, Azimipour F
  [携帯電話へのばく露はイン・ビトロ培養中のマウスの前胞状卵巣に酸化ストレスを生じる：実験研究] [med./bio.]
  Int J Reprod Biomed (Yazd) 17 (9): 637-646
• 2019, Brech A, Kubinyi G, Németh Z, Bakos J, Fiocchi S, Thuróczy G
  [イン・ビトロでの血液白血球に対する中間周波磁界の遺伝毒性作用] [med./bio.]
  Mutat Res Genet Toxicol Environ Mutagen 845: 403060
• 2019, Choi EH, Blasiak A, Lee J, Yang IH
  [中枢神経系におけるミエリン化に対する髄鞘形成のための神経活動の変調] [basics]
  Front Neurosci 13: 952
• 2019, Schmidt S, Schüßler M, Hessinger C, Schuster C, Bertulat B, Kithil M, Cardoso MC, Jakoby R
  [マイクロ波は18 GHzで付着哺乳類細胞の電気穿孔を生じる] [tech./dosim.]
  IEEE Access 7: 78698 - 78705
• 2019, Jamil MMA, Rahman NAA, Bin Hj Mohd MN, Adon MN
  [Hela細胞の挙動に対するパルス電界の影響] [med./bio.]
  2019 IEEE 15th International Colloquium on Signal Processing & Its Applications (CSPA), Penang, Malaysia. IEEE: 147-151, ISBN 9781538675649