キーワード:
電撃傷, "elektrischer Schlag", Elektrounfall, Stromschlag, Stromunfall, "electrical injury", "electric shock"
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2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE), Wuhan, China. IEEE: 1-7; ISBN 978-1-7281-9660-2
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2020,
Camponogara M, Marchesan APG, Bernardon DP, Marchesan TB, Pepe FC, dos Santos GJG, de Chiara LM
2020 IEEE PES Transmission & Distribution Conference and Exhibition - Latin America (T&D LA), Montevideo, Uruguay. IEEE: 1-6; ISBN 978-1-7281-4156-5
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2020,
Brenner B, Majano D
2020 IEEE IAS Electrical Safety Workshop (ESW), Reno, NV, USA. IEEE: 1-5; ISBN 978-1-7281-6439-7
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2020,
Klapper U, Burtscher M
2020 IEEE IAS Electrical Safety Workshop (ESW), Reno, NV, USA. IEEE: 1-4; ISBN 978-1-7281-6439-7
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2020,
Liu B, Guo L, Zhang J, Chen X, Huang J, Ma Y, Zhou L
2020 5th Asia Conference on Power and Electrical Engineering (ACPEE), Chengdu, China. IEEE: 1568-1572; ISBN 978-1-7281-5282-0
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2020,
Tretiakova L, Rebuel E, Opryshko V
2020 IEEE 7th International Conference on Energy Smart Systems (ESS), Kyiv, Ukraine. IEEE: 409-412; ISBN 978-1-7281-9788-3
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2020,
Ershov AM, Khlopova AV, Sidorov AI
2020 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM), Sochi, Russia. IEEE: 1-5; ISBN 978-1-7281-4591-4
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International Electrotechnical Commission (IEC),
IEC TR 60479-4:2020: 1-33, ISBN 978-2-8-3227888-8
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2020,
Baaken D, Dechent D, Drießen S, Merzenich H
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-156/20: 1-108
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2019 2nd World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM), Shanghai, China. IEEE: 59-63; ISBN 978-1-7281-5046-8