キーワード:
電磁干渉, "elektromagnetische Interferenz", "electromagnetic interference"
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2023,
Gao Y, Qi D, Li C, Zhao H
2023 4th International Conference on Computer Engineering and Application (ICCEA), Hangzhou, China. IEEE: 56-60; ISBN 9798350347555
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2023,
Min GH, Kwon H, Lee J, Ha JI
2023 IEEE Applied Power Electronics Conference and Exposition (APEC), Orlando, FL, USA. IEEE: 2124-2128; ISBN 978-1-6654-7540-2
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2023,
Nandikanti A, Zheng J, Hu W, Chen J
2023 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 81-82; ISBN 978-1-6654-7642-3
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2022,
Jiang F, Bhusal B, Sanpitak P, Webster G, Popescu A, Kim D, Bonmassar G, Golestanirad L
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Glasgow, Scotland, United Kingdom. IEEE: 4014-4017; ISBN 978-1-7281-2783-5
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2022,
Nordin MA, Sapuan SZ, Arokiaswami A, Nasimuddin N, Othman N, Fahrul M, Amer AAG
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-3; ISBN 978-1-6654-8978-2
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2022,
Sanchez Aquino JM, Arroyo Pizarro A, Amaya Fariño LM, Jaramillo Chamba DA, Jaramillo Infante MK
Guarda T, Portela F, Augusto MF (eds.): Advanced Research in Technologies, Information, Innovation and Sustainability. Communications in Computer and Information Science, 1676巻; Springer, Cham; 205-217; ISBN 978-3-031-20315-2
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2022,
Yang X, Guo R, Zheng J, Chen J
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), Spokane, WA, USA. IEEE: 606-609; ISBN 978-1-6654-0930-8
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2022,
Nishikawa T, Hikage T, Yamamoto M
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: 124-125; ISBN 978-1-6654-3239-9
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2022,
Cao B, He X, Lu J, Yu Z, Qi D, Li B
2022 IEEE 10th International Conference on Computer Science and Network Technology (ICCSNT), Dalian, China. IEEE: 155-157; ISBN 978-1-6654-7062-9
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2022,
Svistunou A, Mordachev V, Sinkevich E, Ye M, Dubovik A, Shakinka I
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 537-542; ISBN 978-1-6654-0789-2