キーワード:
高電圧直流送電システム, Hochspannungs-Gleichstrom-Übertragung, HVDC, HGÜ, "High Voltage Direct Current transmission system"
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2024,
Competence Centre Electromagnetic Fields (KEMF)
Federal Office for Radiation Protection (BfS) (ed.),
Spotlight, Jan/2024 no.3: 1-3
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2024 32nd Southern African Universities Power Engineering Conference (SAUPEC), Stellenbosch, South Africa. IEEE: 1-6; ISBN 9798350371352
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2023,
Buono L, Guarniere MR, Marzinotto M, Palone F, Papi L, Spezie R, Tresso G, Vacante P, Pigini A, Cortina R
2023 AEIT HVDC International Conference (AEIT HVDC), Rome, Italy. IEEE: 1-6; ISBN 9798350324907
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2023,
Al Salameh MSH, Al-Zughool MR
2023 24th International Conference on Applied Electromagnetics and Communications (ICECOM), Dubrovnik, Croatia. IEEE: 1-4; ISBN 9798350313024
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2023,
Gao C, Zhang Z, Xu J, Gao T, Chen S, Li X
2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM), Seattle, WA, USA. IEEE: 1-7; ISBN 9798350342475
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2023,
Liu L, Liao M, Jia L, Li B, Wan W
2023 2nd International Conference on Power Electronics and Electrical Technology, Chongqing, China. Journal of Physics: Conference Series, 2656巻; IOP Publishing: 012013; ISBN 978-1-7138-8535-1
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2023,
Nazemi M, Dommerque R, Daniel S
2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Krakow, Poland. IEEE: 1-6; ISBN 9798350324013
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2023,
Huber P, Mohanty P, Jenau F
2023 IEEE Electrical Insulation Conference (EIC), Quebec City, QC, Canada. IEEE: 1-4; ISBN 978-1-6654-9342-0
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2023,
Cui H, Zhu F, Wu Q, Zhang X, Guo Y
2023 Panda Forum on Power and Energy (PandaFPE), Chengdu, China. IEEE: 812-817; ISBN 9798350321180
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2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
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2022,
Kim D, Kim M, Lee S, Lee Y, Kim Y
2022 9th International Conference on Condition Monitoring and Diagnosis (CMD), Kitakyushu, Japan. IEEE: 687-690; ISBN 978-1-6654-7015-5
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2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: 1-4; ISBN 978-1-6654-0751-9
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Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS-RESFOR-195/22: 1-309
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2021,
Hussain K, Lu T, Siddique A
2021 International Conference on Advanced Electrical Equipment and Reliable Operation (AEERO), Beijing, China. IEEE: 1-6; ISBN 978-1-6654-0265-1
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2021,
Zhao Y, Dai Y, Wu W, Meng L, Lin S, Ma P
22nd International Symposium on High Voltage Engineering (ISH 2021), Hybrid Conference, Xi'an, China. IET: 1303-1308; ISBN 978-1-83953-605-2
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2021,
Solovyev Y, Arevalo L
22nd International Symposium on High Voltage Engineering (ISH 2021), Hybrid Conference, Xi'an, China. IET: 97-101; ISBN 978-1-83953-605-2
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2021,
Farooq U, Yang F, Shaikh JA, Shoaib Bhutta M, Aslam F, Tao W, Jinxian L, Ul Haq I
2021 International Conference on Advanced Electrical Equipment and Reliable Operation (AEERO), Beijing, China. IEEE: 1-6; ISBN 978-1-6654-0265-1
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2021 IEEE 4th International Electrical and Energy Conference (CIEEC), Wuhan, China. IEEE: 1-6; ISBN 978-1-7281-7150-0
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2021,
Yang W, Chen Q, Xu H, Li Y, Liang W, Dawalibi FP
2021 4th International Conference on Energy, Electrical and Power Engineering (CEEPE), Chongqing, China. IEEE: 599-604; ISBN 978-1-6654-3364-8
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2020,
Dürrenberger G, Fröhlich J, Röösli M
1-114
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2018,
Chen X, Liu HC, Gong HT, Wang HH, Zhang JH
2018 International Conference on Power System Technology (POWERCON), Guangzhou, China. IEEE: 1-5; ISBN 978-1-5386-6462-9
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2018,
Hutchison ZL, Sigray P, He H, Gill AB, King J, Gibson C
Bureau of Ocean Energy Management (U.S. Department of the Interior) (BOEM),
OCS Study BOEM 2018-003: 1-254
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2018,
Cieslar G, Sowa P, Sieron K, Sieron A
2018 Baltic URSI Symposium (URSI), Poznan, Poland. IEEE: 5-6; ISBN 978-1-5386-1360-3
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2018,
Zhu T, Wang S, Zhang N, Yan Y, Guo Z, Wang S, Wang S
2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE), Athens, Greece. IEEE: 1-4; ISBN 978-1-5386-5087-5
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2017 Nineteenth International Middle East Power Systems Conference (MEPCON), Cairo, Egypt. IEEE: 1276-1280; ISBN 978-1-5386-0991-0