キーワード:
Mortalität, Sterblichkeit, Sterberate, "death rate", mortality, 死亡率
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2023,
Abtahi I, Ali H, Haque MI, Rashid SZ, Hossain T, Chakraborty S, Gafur A, Alam ME
2023 5th International Conference on Sustainable Technologies for Industry 5.0 (STI), Dhaka, Bangladesh. IEEE: 1-6; ISBN 9798350394320
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2023,
Jahan I, Noman MOF, Tasnim MES, Kabir MA
2023 5th International Conference on Sustainable Technologies for Industry 5.0 (STI), Dhaka, Bangladesh. IEEE: 1-6; ISBN 9798350394320
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2023,
Nazir N, Sheikh JA, Khan UR
2023 10th IEEE Uttar Pradesh Section International Conference on Electrical, Electronics and Computer Engineering (UPCON), Gautam Buddha Nagar, India. IEEE: 598-601; ISBN 9798350382488
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2021,
Ramos V, Marina P, Torres-Ruiz M, Suárez OJ, López V, Liste I, De Alba M
2021 Photonics & Electromagnetics Research Symposium (PIERS), Hangzhou, China. IEEE: 2800-2807; ISBN 978-1-6654-0988-9
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2021,
Islam R, Mahbub F, Al-Nahiun SAK, Rabbi MIH
2021 IEEE 12th Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), Vancouver, BC, Canada. IEEE: 1040-1045; ISBN 978-1-6654-0067-1
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2021,
Ge Z, Zhou J, Rao X, Zhu Z, Wu D, Li P, Zhang P, Li M
2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Chengdu, China. IEEE: 1-2; ISBN 978-1-7281-9425-7
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2019,
Nykyforov V, Yelizarov M, Sakun O, Pasenko A, Maznytska O
2019 IEEE International Conference on Modern Electrical and Energy Systems (MEES), Kremenchuk, Ukraine. IEEE: 514-517; ISBN 978-1-7281-2570-1
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Institute for Quality and Efficiency in Health Care (IQWiG),
Rapid Report N18-02 Version 1.1, IQWiG-Berichte – Nr. 772: 1-62
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2018 IEEE IAS Electrical Safety Workshop (ESW), Fort Worth, TX, USA. IEEE: 1-8; ISBN 978-1-5386-1560-7
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2017,
Di Meo S, Massoni E, Silvestri L, Obbad J, Pasian M, Dondi D, Bozzi M, Perregrini L, Alaimo G, Marconi S, Auricchio F
2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), Pavia, Italy. IEEE; ISBN 978-1-5386-0481-6