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2022,
Carnecka L, Bajtos M, Judakova Z, Radil R, Janousek L
2022 ELEKTRO (ELEKTRO), Krakow, Poland. IEEE: 1-5; ISBN 978-1-6654-6727-8
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2021,
Concepcion R, Izzo LG, Cuello J, Sybingco E, Dadios E
2021 IEEE 13th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM), Manila, Philippines. IEEE: 1-6; ISBN 978-1-6654-0168-5
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2021,
Blachowicz T, Ehrmann A, Malczyk M, Stasiak A, Osadnik R, Paluch R, Koruszowic M, Pawlyta J, Lis K, Lehrich K
2021 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), Mauritius, Mauritius. IEEE: 1-8; ISBN 978-1-6654-2943-6
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2021 International Workshop on Impedance Spectroscopy (IWIS), Chemnitz, Germany. IEEE: 85-88; ISBN 978-1-6654-9473-1
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2021,
Che K, Yu J, Yang P, Wei M, Liu S, Li D
2021 13th IEEE PES Asia Pacific Power & Energy Engineering Conference (APPEEC), Thiruvananthapuram, India. IEEE: 1-4; ISBN 978-1-6654-4879-6
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2021,
Ge Z, Zhou J, Rao X, Zhu Z, Wu D, Li P, Zhang P, Li M
2021 46th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz), Chengdu, China. IEEE: 1-2; ISBN 978-1-7281-9425-7
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2021 8th International Conference on Signal Processing and Integrated Networks (SPIN), Noida, India. IEEE: 98-101; ISBN 978-1-6654-0255-2
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2021,
Bandeira ID, Lins-Silva DH, Barouh JL, Faria-Guimarães D, Dorea-Bandeira I, Souza LS, Alves GS, Brunoni AR, Nitsche M, Fregni F, Lucena R
Cohen Kadosh R, Zaehle T, Krauel K (eds.): Non-invasive Brain Stimulation (NIBS) in Neurodevelopmental Disorders. Progress in Brain Research, 264巻; Elsevier, Amsterdam; 57-89; ISBN 978-0-12-822344-4
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2021,
Pyankov VF, Kryukova OV, Kopylov AF, Aldonin GM, Salomatov YP
2021 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus), St. Petersburg, Moscow, Russia. IEEE: 1814-1816; ISBN 978-1-6654-4642-6
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2021,
Teplan M, VuViet H, Bereta M, Bajla I
2021 13th International Conference on Measurement, Bratislava, Slovakia. IEEE: 190-193; ISBN 978-1-6654-3245-0