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97件のアイテムが見つかりました。 以下のアイテムが含まれています:

• trees

• 2018, Zhou H, Sun L, Yang Y, Liu C, Liu T, Xie P, Ma L
  Reduction of electric field strength by two species of trees under power transmission lines [tech./dosim.]
  J For Res (Harbin) 29 (5): 1415-1422
• 2017, Gora EM, Bitzer PM, Burchfield JC, Schnitzer SA, Yanoviak SP
  Effects of lightning on trees: A predictive model based on in situ electrical resistivity [tech./dosim.]
  Ecol Evol 7 (20): 8523-8534
• 2003, Ali IA, Al-Jabr AM
  [詳細] A waveguide irradiation chamber for destruction of red palm weevils (Rhynchophorus ferrugineus) inside a block sample of a palm tree trunk [med./bio.]
  J Microw Power Electromagn Energy 38 (2): 137-146
• 2021, Weyrauch D, Gill JR
  Accidental Deaths Involving Trees: Professional and Nonprofessional Woodcutting and Tree Failures With Autopsy Findings [elec. inj.]
  Am J Forensic Med Pathol 42 (4): 350-353
• 2016, Waldmann-Selsam C, Balmori-de la Puente A, Breunig H, Balmori A
  Radiofrequency radiation injures trees around mobile phone base stations [med./bio.]
  Sci Total Environ 572: 554-569
• 1996, Selga T, Selga M
  [詳細] Response of Pinus sylvestris L. needles to electromagnetic fields. Cytological and ultrastructural aspects [med./bio.]
  Sci Total Environ 180 (1): 65-73
• 1996, Balodis V, Brumelis G, Kalviskis K, Nikodemus O, Tjarve D, Znotina V
  Does the Skrunda Radio Location Station diminish the radial growth of pine trees? [med./bio.]
  Sci Total Environ 180 (1): 57-64
• 2022, Sudsiri CJ, Jumpa N, Ritchie RJ
  Stimulation of propagation of para-rubber tree grafts using electromagnetic field irradiation [med./bio.]
  Biocatal Agric Biotechnol 40: 102300
• 2017, Jin L, Peng C, Jiang T
  System-Level Electric Field Exposure Assessment by the Fault Tree Analysis [tech./dosim.]
  IEEE Trans Electromagn Compat 59 (4): 1095-1102
• 1983, Collins EW, Cooley WL
  Use of Event Tree Analysis to Optimize Electrical Accident Countermeasure Systems for Metal/Non-Metal Mines [tech./dosim.]
  1983 Annual Meeting Industry Applications Society, Mexico City, Mexico. IEEE: 139-151; ISBN 978-1-5090-3188-7