Die folgenden Begriffe wurden einbezogen:
"far field", Fernfeld, 遠方界
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2022,
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2022,
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2022,
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2022,
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2022,
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2022,
Toribio D, Joseph W, Thielens A
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Institute of Electrical and Electronics Engineers (IEEE),
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2021 5th International Conference on Electrical Information and Communication Technology (EICT), Khulna, Bangladesh. IEEE: S. 1-6; ISBN 978-1-6654-0907-0
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2021,
Tran P, Richardson ML, Zeng FG
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2021,
Rivera González MX, Félix González N, López I, Ochoa Zambrano JS, Miranda Martínez A, Maestú Unturbe C
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2021,
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PLoS Comput Biol 17 (10): e1009460
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2021,
De Miguel-Bilbao S, Hernandez JA, Suarez OJ, Marina P, Febles VM, Rabassa LE, Suarez S, Karpowicz J, Zradzinski P, Gryz K, Aguirre E, Ramos V
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, Raleigh, NC, USA. IEEE: S. 13-18; ISBN 978-1-6654-4889-5
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IEEE Access 9: 125342-125347
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2021,
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2021,
Wang X, Xia C, Lu L, Qi H, Zhang J
Front Public Health 9: 721166
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2021,
Lagorio S, Blettner M, Baaken D, Feychting M, Karipidis K, Loney T, Orsini N, Röösli M, Paulo MS, Elwood M
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Institute of Electrical and Electronics Engineers (IEEE),
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2021,
Kim I, Lee SG, Nam YH, Lee JH
Sensors 21 (4): 1431
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2021,
Le Coq L, Mézières N, Leroy P, Fuchs B
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2021,
van Wel L, Liorni I, Huss A, Thielens A, Wiart J, Joseph W, Röösli M, Foerster M, Massardier-Pilonchery A, Capstick M, Cardis E, Vermeulen R
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2021,
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2021,
Cabré-Riera A, van Wel L, Liorni I, Thielens A, Birks LE, Pierotti L, Joseph W, González-Safont L, Ibarluzea J, Ferrero A, Huss A, Wiart J, Santa-Marina L, Torrent M, Vrijkotte T, Capstick M, Vermeulen R, Vrijheid M, Cardis E, Röösli M, Guxens M
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2020,
Rotenberg SA, Podilchak SK, Re PDH, Mateo-Segura C, Goussetis G, Lee J
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2020,
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J Neural Eng 17 (1): 016037
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2020,
Vilagosh Z, Lajevardipour A, Wood A
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