Die folgenden Begriffe wurden einbezogen:
Hazard, Gefährdungspotenzial, ハザード
-
1984,
Geard CR, Osmak RS, Hall EJ, Simon HE, Maudsley AA, Hilal SK
Radiology 152 (1): 199-202
-
Curr Probl Pediatr 14 (9): 1-87
-
1984,
Ardito G, Lamberti L, Bigatti P, Prono G
Boll Soc Ital Biol Sper 60 (7): 1341-1346
-
J Microw Power 19 (4): 225-231
-
J Microw Power 19 (3): 159-172
-
1984,
Willis RJ, Brooks WM
Magn Reson Imaging 2 (2): 89-95
-
5th Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Zurich, Switzerland. IEEE: S. 93-96; ISBN 9798331500221
-
1983,
Collins EW, Cooley WL
1983 Annual Meeting Industry Applications Society, Mexico City, Mexico. IEEE: S. 139-151; ISBN 978-1-5090-3188-7
-
1983,
New PF, Rosen BR, Brady TJ, Buonanno FS, Kistler JP, Burt CT, Hinshaw WS, Newhouse JH, Pohost GM, Taveras JM
Radiology 147 (1): 139-148
-
1983,
Stuchly MA, Lecuyer DW, Mann RD
Health Phys 45 (3): 713-722
-
1983,
Butrous GS, Male JC, Webber RS, Barton DG, Meldrum SJ, Bonnell JA, Camm AJ
Pacing Clin Electrophysiol 6 (6): 1282-1292
-
J Microw Power 18 (3): 295-304
-
1983,
Nordström S, Birke E, Gustavsson L
Bioelectromagnetics 4 (1): 91-101
-
1982,
Alam S, Jerabek MA, Baset M, Cooley WL
1982 Annual Meeting Industry Applications Society, San Francisco, CA, USA. IEEE: S. 105-108; ISBN 978-1-5090-3187-0
-
IEEE Power Engineering Review 2 (10): 23-24
-
1982,
Davydov BI, Karpov VN
Kosm Biol Aviakosm Med 16 (5): 18-23
-
1982,
Kallen B, Malmquist G, Moritz U
Arch Environ Health 37 (2): 81-85
-
Br J Cancer 45 Suppl 5: 101-107
-
1982,
Bini M, Ignesti A, Millanta L, Rubino N, Vanni R
J Microw Power 17 (3): 223-229
-
1982,
Chang BK, Huang AT, Joines WT, Kramer RS
Radio Sci 17: 165S-168S
-
J Microw Power 17 (1): 1-9
-
Gauthérie M, Albert E (Hrsg.): Biomedical Thermology. Progress in Clinical and Biological Research, Band 107; Alan R. Liss, Inc., New York; S. 851-865; ISBN 978-0-8451-0107-0
-
J R Coll Physicians Lond 16 (3): 159-164
-
Bioelectromagnetics 3 (1): 91-103
-
1981,
Smiałkowski T, Koperski A
4th Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Zurich, Switzerland. IEEE: S. 193-196; ISBN 9798331500214