Die folgenden Begriffe wurden einbezogen:
Hochfrequenz, HF, "radio frequency", RF, 無線周波
-
2018,
Aberbour L, Jawad O, Ramdani M, Giry P, Julien T
2018 IEEE Conference on Antenna Measurements & Applications (CAMA), Västerås, Sweden. IEEE: 1-4; ISBN 978-1-5386-5796-6
-
2018,
Denzi A, Merla C, Andre FM, Garcia-Sanchez T, Mir LM, Apollonio F, Liberti M
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: 19-21; ISBN 978-1-5386-5919-9
-
2018,
Ebadi-Shahrivar A, Fay P, Hochwald BM, Love DJ
2018 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, Boston, MA, USA. IEEE: 583-584; ISBN 978-1-5386-7103-0
-
2018,
Kaburcuk F, Elsherbeni AZ
2018 International Applied Computational Electromagnetics Society Symposium (ACES), Denver, CO, USA. IEEE: 1-2; ISBN 978-1-5386-4857-5
-
2018,
Geesink HJH, Meijer DKF
Journal of Modern Physics 9 (5): 898-924
-
2018,
Satriya AB, Setyawati O, Taufik T
2018 International Conference on Computational Science and Computational Intelligence (CSCI), Las Vegas, NV, USA. IEEE: 203-208; ISBN 978-1-7281-1361-6
-
2018,
Janca R, Jezdik P, Jahodova A, Kudr M, Benova B, Celakovsky P, Zamecnik J, Komarek V, Liby P, Tichy M, Krsek P
IEEE Trans Neural Syst Rehabil Eng 26 (11): 2126-2133
-
2018,
Meijer DKF, Geesink HJH
J Cancer Ther 9 (3): 188-230
-
2018,
Shahab L, McGowan JA, Waller J, Smith SG
Eur J Cancer 103: 308-316
-
2018,
Djuric N, Kavecan N, Mitic M, Radosavljevic N, Boric A
2018 22nd International Microwave and Radar Conference (MIKON), Poznan, Poland. IEEE: 258-260; ISBN 978-1-5386-3723-4
-
2018,
Rasic P, Skiljo M, Blazevic Z, Doric V, Poljak D
2018 3rd International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: 1-6; ISBN 978-1-5386-6296-0
-
2018,
Isrie S, Moonen N, Schipper H, Bergsma H, Lefcrink F
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: 500-505; ISBN 978-1-4673-9699-8
-
2018,
Buesink F, Vout-Ardatjew R, Leferink L
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: 918-921; ISBN 978-1-4673-9699-8
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.70 (01/2018): 1-52
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.61 (01/2018): 1-30
-
2018,
Michalowska J, Tofil A, Michalowska J, Jozwik J
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: 167-170; ISBN 978-1-5386-6937-2
-
2018,
Kieliszek J, Wyszkowska J
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: 101-104; ISBN 978-1-5386-6937-2
-
2018 26th Telecommunications Forum (TELFOR), Belgrade, Serbia. IEEE: 1-3; ISBN 978-1-5386-7172-6
-
2018,
Nedic G, Djuric N, Kliajic D, Kasas-Lazetic K, Pascan M
2018 26th Telecommunications Forum (TELFOR), Belgrade, Serbia. IEEE: 1-4; ISBN 978-1-5386-7172-6
-
2018,
Michalowska J, Tofil A, Jozwik J, Pytka J, Budzynski P, Korzeniewska E
2018 IEEE 4th International Symposium on Wireless Systems within the International Conferences on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS-SWS), Lviv, Ukraine. IEEE: 162-165; ISBN 978-1-5386-7588-5
-
2018,
Ashyap AYI, Dahlan SH, Abidin ZZ, Majid HA, Seman FC, Ngu X, Cholan NA
2018 IEEE International RF and Microwave Conference (RFM), Penang, Malaysia. IEEE: 69-72; ISBN 978-1-5386-6721-7
-
2018,
Okuyucu S, Secmen M, Yegin K, Özbakts B
2017 10th International Conference on Electrical and Electronics Engineering (ELECO), Bursa, Turkey. IEEE: 1004-1008; ISBN 978-1-5386-1723-6
-
2018,
Ahmed MI, Ahmed MF, Shaalan AA
2017 Japan-Africa Conference on Electronics, Communications and Computers (JAC-ECC), Alexandria, Egypt. IEEE: 144-147; ISBN 978-1-5386-2515-6
-
2018,
Ryan HA, Hirakawa S, Yang E, Zhou C, Xiao S
IEEE Trans Biomed Circuits Syst 12 (2): 338 - 350
-
2018,
Ishii N, Shimizu Y, Nagaoka T, Watanabe S
2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM), Nagoya, Japan. IEEE: 1-2; ISBN 978-1-5386-4835-3