-
2019,
Halim MA, Samman JM, Smith SE, Arnold DP
2019 19th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS), Krakow, Poland. IEEE: S. 1-5; ISBN 978-1-7281-5639-2
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2019 IEEE 3rd International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: S. 1507-1512; ISBN 978-1-7281-1676-1
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2019 IEEE Pulsed Power & Plasma Science (PPPS), Orlando, FL, USA. IEEE: S. 1-6; ISBN 978-1-5386-7970-8
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2019,
Caramazza L, De Angelis A, Della Valle E, Denzi A, Nardoni M, Paolicelli P, Petralito S, Apollonio F, Liberti M
2019 49th European Microwave Conference (EuMC), Paris, France. IEEE: S. 220-223; ISBN 978-1-7281-1798-0
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2019,
Kainz A, Steiner H, Hortschitz W, Schalko J, Jachimowicz A, Keplinger F
2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII), Berlin, Germany. IEEE: S. 2114-2117; ISBN 978-1-5386-8105-3
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2019,
Paulet M, Lazarescu C, Bejenaru O, Salceanu A
2019 11th International Symposium on Advanced Topics in Electrical Engineering (ATEE), Bucharest, Romania. IEEE: S. 1-5; ISBN 978-1-7281-0102-6
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2018,
Miclaus S, Bechet P, Mihai G, Moisescu C, Ardelean I, Barbu-Tudoran L, Radu TM, Oancea S, Racuciu M
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 0143-0148; ISBN 978-1-5386-5063-9
-
2018,
Song B, Timoshkin I, Maclean M, Wilson M, Given M, MacGregor SJ, Satoh K, Kawaguchi H
2017 IEEE 21st International Conference on Pulsed Power (PPC), Brighton, UK. IEEE: S. 1-6; ISBN 978-1-5090-5749-8
-
2018,
Zharkova LP, Romanchenko IV, Buldakov MA, Priputnev PV, Bolshakov MA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: S. 158-161; ISBN 978-1-5386-6892-4
-
2017,
Zharkova L, Romanchenko I, Bolshakov M, Rostov V
5th International Congress on Energy Fluxes and Radiation Effects 2016 Tomsk, Russian Federation. Journal of Physics: Conference Series, Band 830; IOP Publishing: S. 012010; ISBN 978-1-5108-4041-6