Three groups were examined: 1) control group, 2.) exposure to an electric field of 12 kV/m and 3.) exposure to an electric field of 18 kV/m. After two weeks of exposure, visual evoked potentials were recorded under anesthesia. The day after, rats were sacrificed and brain samples were taken for analysis of the oxidative stress.
|Chamber||rats were allowed to move freely in a plastic cage, placed between the plates|
|Setup||parallel copper plates (50 x 80 cm) were plated with zinc (2 mm thickness) and positioned parallel to each other, placed upright on wooden stands; cables were connected to the center of the plates on their outer surfaces to preserve homogeneity of the electric field|
|Sham exposure||A sham exposure was conducted.|
|Additional info||the plates were spaced at 50 cm in distance for 12 kV /m electric field|
|electric field strength||12 kV/m||-||measured||-||11.700 kV/m - 11.890 kV/m|
|electric field strength||18 kV/m||-||measured||-||17.568 kV/m - 17.853 kV/m|
The lipid peroxidation, the total oxidant status and the oxidative stress index were significantly increased in the brain and retina of exposed rats when compared to the control group while the total antioxidant status was significantly decreased. Regarding lipid peroxidation a dose related effect was observed: The values of the 18 kV/m-exposed group were significantly higher than those of the 12 kV/m-exposed group.
The latencies of the visual evoked potentials were significantly elongated in the exposed groups compared to the control group. Additionally, the latencies were significantly longer in the 18 kV/m exposed group than in the 12 kV/m exposed group.
The authors suggest, that exposure to extremely low frequency electric fields could change visual evoked potentials in rats and that these changes could be explained by increased oxidative stress levels.