Solutions for EM exposure assessment of 5G wireless devices tech./dosim.

掲載誌: 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE, 2018: pp. 92-94; ISBN 978-1-5090-3955-5

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