[低周波近傍界波源シナリオに適用した確率論的ドシメトリ] tech./dosim.

Stochastic Dosimetry applied on a low frequency Near-Field Source Scenario

掲載誌: 2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE, 2020: 429-433; ISBN 978-1-7281-5201-1

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