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2020,
Halašová E, Tóthová B, Kmeťová Sivoňová M, Okajčeková T, Škovierová H, Špánik P, Pavelek M, Frivaldský M
2020 ELEKTRO, Taormina, Italy. IEEE: 1-6; ISBN 978-1-7281-7543-0
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2020,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2020:04: 1-82
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2020,
Uluaydin NK, Cerezci O, Seker SS
2020 10th Annual Computing and Communication Workshop and Conference (CCWC), Las Vegas, NV, USA. IEEE: 780-783; ISBN 978-1-7281-3784-1
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Food and Drug Administration (FDA),
Review: 1-112
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2020,
Freire RC, Cabrera-Abreu C, Milev R
Kim YK (ed.): Anxiety Disorders. Advances in Experimental Medicine and Biology, 1191巻; Springer, New York; 331-346; ISBN 978-981-329-704-3
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German Social Accident Insurance (DGUV),
IFA Report, 1/2019: 1-211, ISBN 978-3-86423-237-4
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2019,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2019:08: 1-104
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2019,
Rubtsova NB, Perov SYu, Belaya OV, Konshina TA
2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring), Rome, Italy. IEEE: 1445-1448; ISBN 978-1-7281-3404-8
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2019,
Small AT, Dougherty ET
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 2340-2343; ISBN 978-1-5386-1312-2
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2019,
Nykyforov V, Yelizarov M, Sakun O, Pasenko A, Maznytska O
2019 IEEE International Conference on Modern Electrical and Energy Systems (MEES), Kremenchuk, Ukraine. IEEE: 514-517; ISBN 978-1-7281-2570-1
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2019,
Chi PY, Spuul P, Tseng FG, Genot E, Chou CF, Taloni A
La Porta CAM, Zapperi S (eds.): Cell Migrations: Causes and Functions. Advances in Experimental Medicine and Biology, 1146巻; Springer, New York; 79-103; ISBN 978-3-030-17592-4
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2019,
Singh KV, Gautam R, Nirala JP, Nanda R, Paulraj R
2019 URSI Asia-Pacific Radio Science Conference (AP-RASC), New Delhi, India. IEEE: 1; ISBN 978-1-5386-8551-8
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2018,
Al-Saadi M, Al-Qaisi M, Al-Bahrani L, Al-Omari A, Craciunescu A
2018 International Symposium on Fundamentals of Electrical Engineering (ISFEE), Bucharest, Romania. IEEE: 1-6; ISBN 978-1-5386-7213-6
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2018 9th International Conference on Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), Odessa, Ukraine. IEEE: 69-73; ISBN 978-1-5386-2469-2
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2018 3rd International Conference and Workshops on Recent Advances and Innovations in Engineering (ICRAIE), Jaipur, India. IEEE: 1-6; ISBN 978-1-5386-4526-0
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2018,
Qiu H, Wang X, Joshi R, Zhao W
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: 202-204; ISBN 978-1-5386-5919-9
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2018,
Wyszkowska J, Jankowska M, Stankiewicz M
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Song B, Timoshkin I, Maclean M, Wilson M, Given M, MacGregor SJ, Satoh K, Kawaguchi H
2017 IEEE 21st International Conference on Pulsed Power (PPC), Brighton, UK. IEEE: 1-6; ISBN 978-1-5090-5749-8
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2018,
Gurhan H, Bruzón R, Xiong Y, Barnes F
2018 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 1-2; ISBN 978-1-5386-5031-8
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2018,
Verma S, Keshri GK, Sharma M, Mani KV, Karmakar S, Chauhan S, Gupta A
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: 175-177; ISBN 978-1-5386-5919-9
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2018,
Chiaramello E, Parazzini M, Fiocchi S, Bonato M, Ravazzani P, Wiart J
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: 1-4; ISBN 978-1-5386-3764-7
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Mobile Communications and Public Health. CRC Press: 165-186; ISBN 978-1-138-56842-6
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2018,
Sowa P, Sieron K, Cieslar G, Sieron A
2018 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Wolmar, Mauritius. IEEE: 1-2; ISBN 978-1-5386-6459-9
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2018,
Wang L, Yang J, Wang F, Zhou P, Wang K, Ming D
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 259-262; ISBN 978-1-5386-3647-3
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2018,
Knyazeva IR, Medvedev MA, Kutenkov OP, Vasilev AV, Gorokhovsky AA, Rostov VV
2018 20th International Symposium on High-Current Electronics (ISHCE), Tomsk, Russia. IEEE: 94-97; ISBN 978-1-5386-6892-4