-
2019,
Ibrahim AU, Zhong W, Cui H, Li H, Xu D
2019 IEEE Energy Conversion Congress and Exposition (ECCE), Baltimore, MD, USA. IEEE: 4575-4579; ISBN 978-1-7281-0396-9
-
2019,
Campi T, Cruciani S, Maradei F, Feliziani M
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: 1116-1121; ISBN 978-1-7281-0595-6
-
Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019: 1-312, ISBN 978-1-5044-5548-0
-
French Agency for Food, Environmental and Occupational Health & Safety (ANSES),
ANSES Opinion, Request No 2013-SA-0038: 1-14
-
2019,
Chung YD, Kim DW, Park EY
2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia), Busan, Korea (South). IEEE: 2240-2245; ISBN 978-1-7281-1612-9
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2019,
Lagouanelle P, Krauth VL, Pichon L
2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), Torino, Italy. IEEE: 1-5; ISBN 978-1-7281-3278-5
-
International Electrotechnical Commission (IEC),
IEC TR 62669:2019: 1-124, ISBN 978-2-8-3226795-0
-
2018 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (Wow), Montreal, QC, Canada. IEEE: 1-5; ISBN 978-1-5386-2466-1
-
2018,
Pavel I, David V, Donose C
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 0568-0571; ISBN 978-1-5386-5063-9
-
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 693-696; ISBN 978-1-5386-5063-9
-
2018,
Liorni I, Capstick M, Kuehn S, Kuster N
2018 IEEE Wireless Power Transfer Conference (WPTC), Montreal, QC, Canada. IEEE: 1-4; ISBN 978-1-5386-5160-5
-
2018,
Herrala M, Kumari K, Blomme A, Khan MW, Koivisto H, Naarala J, Roivainen P, Tanila H, Viluksela M, Juutilainen J
Eskola H, Väisänen O, Viik J, Hyttinen J (eds.): EMBEC & NBC 2017: Joint Conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 2017. IFMBE Proceedings, 65巻; Springer, Singapore; 719-722; ISBN 978-981-10-5121-0
-
2018 IEEE International Symposium on Signal Processing and Information Technology (ISSPIT), Louisville, KY, USA. IEEE: 1-5; ISBN 978-1-5386-7569-4
-
2018,
Petrella RA, Mollica PA, Zamponi M, Xiao S, Bruno RD, Sachs PC
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: 100-102; ISBN 978-1-5386-5919-9
-
2018,
Zhao Y, Lai JJ, Wu XY, Qu W, Wang MQ, Chen L, Hu N, Wang X, Hou WS
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 2240-2243; ISBN 978-1-5386-3647-3
-
Institute of Electrical and Electronics Engineers (IEEE),
IEEE C95.2-2018: 1-28
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.91 (01/2018): 1-80
-
2018,
Rasic P, Skiljo M, Blazevic Z, Doric V, Poljak D
2018 3rd International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: 1-6; ISBN 978-1-5386-6296-0
-
International Telecommunication Union (ITU),
ITU-T Recommendations K-Series, K.61 (01/2018): 1-30
-
2018,
Du X, Ma X, Li L, Li H, Cheng X, Hwang JCM
2018 IEEE/MTT-S International Microwave Symposium - IMS, Philadelphia, PA, USA. IEEE: 1148-1151; ISBN 978-1-5386-5068-4
-
2018,
Chaoqun L, Xiaokang W, Bin W, Yan G
2018 IEEE 2nd International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: 507-512; ISBN 978-1-5386-5393-7
-
2018,
Clemens M, Zang M, Alsayegh B, Schmuelling B
2018 IEEE International Magnetics Conference (INTERMAG), Singapore. IEEE: 1; ISBN 978-1-5386-6426-1
-
2018,
Hamnerius Y, Nilsson T, Rylander T, Winges J, Ekman C, Petersson C, Fransson T
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: 1-4; ISBN 978-1-5386-3764-7
-
2017,
Ushiyama A, Kunugita N, Suzuki Y, Wada K, Matsubara K, Terai T, Yoshino H, Hattori K, Ishii K, Iwanami Y, Ohtani S
2016 URSI Asia-Pacific Radio Science Conference (URSI AP-RASC), Seoul, Korea (South). IEEE: 2030-2031; ISBN 978-1-4673-9983-8
-
International Electrotechnical Commission (IEC),
IEC 62232:2017: 1-516, ISBN 978-2-8-3226302-0