キーワード:
原子間力顕微鏡, Rasterkraftmikroskopie, "scanning force microscopy", "atomic force microscopy", 走査型フォース顕微鏡法
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2018,
Wang F, Wang Y, Huang T, Guo F, Liu J, Song Z, Weng Z, Wang Z, Wang Z
2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, China. IEEE: 174-177; ISBN 978-1-5386-1082-4
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2013,
Choi S, Shin JH, Nam SW, Jang H, Tao T, Kwak HW, Jin KH, Lee GJ, Park HK
2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Osaka, Japan. IEEE: 3761-3764; ISBN 978-1-4577-0216-7
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2005,
Zhadobov M, Vié V, Sauleau R, Himdi M, Le Coq L, Artzner F, Orlov I, Thouroude D
1th International Symposium on Antenna Technology and Applied Electromagnetics [ANTEM 2005], St. Malo. IEEE; ISBN 978-0-9738425-0-0
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2019,
Chafai DE, Sulimenko V, Havelka D, Kubínová L, Dráber P, Cifra M
Adv Mater 31 (39): e1903636
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2019,
Zheng Y, Wang Q, Yang X, Nie W, Zou L, Liu X, Wang K
Anal Chem 91 (3): 1954-1961
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2008,
Yang L, Li H, Wang K, Tan W, Yang W, Zheng J
Anal Chem 80 (16): 6222-6227
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1998,
Girasole M, Cricenti A, Generosi R, Congiu-Castellano A, Pozzi D, Pasquali E, Lisi A, Santoro N, Grimaldi S
Appl Phys A Mater Sci Process 67 (2): 219-223
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2001,
Girasole M, Cricenti A, Generosi R, Congiu-Castellano A, Pozzi D, Pasquali E, Lisi A, Grimaldi S
Appl Phys Lett 78 (20): 3145-3147
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2022,
Gorobets S, Gorobets O, Gorobets Y, Bulaievska M
Bioelectromagnetics 43 (2): 119-143
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2014,
Thompson GL, Roth C, Tolstykh G, Kuipers M, Ibey BL
Bioelectromagnetics 35 (4): 262-272