キーワード:
磁界強度, "magnetische Feldstärke", H-Feld, "magnetic field strength", "H field"
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2016,
Salceanu A, Lunca E, Neacsu O, Iacobescu F
2016 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. International Conference and Exposition on Electrical and Power Engineering; IEEE: 592-597
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2016,
Cobianu C, Fidel N, Stan MF, Husu AG
2016 8th International Conference on Electronics, Computers and Artificial Intelligence (ECAI), Ploiesti, Romania. IEEE: 1-6; ISBN 978-1-5090-2048-5
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2016,
Karpowicz J, Bienkowski P, Kieliszek J
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: 668-671; ISBN 978-1-5090-1417-0
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2016,
Akramova MS, Korobeynikov SM, Akramov BK
2016 11th International Forum on Strategic Technology (IFOST), Novosibirsk. IEEE; ISBN 978-1-4673-8812-2
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2016,
Kurnaz C, Engiz BK, Bozkurt MC
2016 16th Mediterranean Microwave Symposium (MMS), Abu Dhabi. IEEE; ISBN 978-1-5090-2587-9
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2016,
Kim BC, Jeon SB, Moon JI, Kim SM, Kim SW, Cho IK
2016 IEEE Global Electromagnetic Compatibility Conference (GEMCCON), Mar del Plata, Argentina. IEEE; ISBN 978-1-5090-4266-1
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2016,
Korovkin N, Diop CY
2016 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW), St. Petersburg, Russia. IEEE: 604-607; ISBN 978-1-5090-0445-4
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2015,
Jog SR, Paranjape PM
2015 International Conference on Energy Systems and Applications, Pune, India. IEEE: 706-711; ISBN 978-1-4673-6817-9
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2015,
Kim BC, Kim S-M, Moon J-I, Kwon J-H, Cho I-K
2015 IEEE Global Electromagnetic Compatibility Conference (GEMCCON), Adelaide, SA, Australia. IEEE: 1-3; ISBN 978-1-4673-8548-0
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2015,
Bjelica J, Djuric N, Kljajic D, Milutinov M, Fanti A
2015 23rd Telecommunications Forum Telfor (TELFOR), Belgrade, Serbia. IEEE: 539-542; ISBN 978-1-5090-0055-5
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2015,
Liu TX, Lang HD, Sarris CD
2015 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting, Vancouver, BC, Canada. IEEE: 115-116; ISBN 978-1-4799-7815-1
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2015,
Aoki Y, Arima T, Uno T, Chakarothai J, Wake K, Fujii K, Watanabe S
2015 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Hsinchu, Taiwan. IEEE: 1-2; ISBN 978-1-4673-6952-7
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2015,
Hashimoto I, Shiba K
2015 IEEE Biomedical Circuits and Systems Conference (BioCAS), Atlanta, GA, USA. IEEE: 1-4; ISBN 978-1-4799-7234-0
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2015,
Hamnerius Y, Nilsson T, Attback K
2015 1st URSI Atlantic Radio Science Conference (URSI AT-RASC), Gran Canaria, Spain. IEEE: 1; ISBN 9789090086286
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2014,
Yngve Hamnerius, Tomas Nilsson
2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 364-368; ISBN 978-1-4799-3226-9
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2014,
Vezinet R, Catrain A, Chretiennot T, Tarayre J, Gibot L, Pillet F, Rols MP
2014 IEEE International Power Modulator and High Voltage Conference (IPMHVC), Santa Fe, NM, USA. IEEE: 41-44; ISBN 978-1-4673-7323-4
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2014,
Aravind KA, Krishna B, Devendranath D, Jha IS, Bhowmick BND, Rao SBR, Suresh Kumar BNVRC
2014 IEEE PES T&D Conference and Exposition, Chicago, IL, USA. IEEE: 373-377; ISBN 978-1-4799-3657-1
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2014,
Koprivica M, Pertic M, Popovic M, Milinkovic J, Niksic S, Neskovic A
2014 22nd Telecommunications Forum Telfor (TELFOR), Belgrade. IEEE: 9-12; ISBN 978-1-4799-6190-0
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2014,
Laakso I, Hirata A, Fujiwara O
2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 202-205; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 194-197; ISBN 978-4-88552-287-1
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ASTM,
ASTM F2182 - 11a
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German Social Accident Insurance (DGUV),
IFA-Report 5/2011: 1-72, ISBN 978-3-86423-011-0
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2011,
Guldimann R, Meier M
State Secretariat for Economic Affairs (SECO), Federal Office of Public Health (FOPH),
1-93
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2010,
Karabetsos E, Kalampaliki E, Tsanidis G, Koutounidis D, Skamnakis N, Kyritsi T, Yalofas A
6th International Workshop on Biological Effects of Electromagnetic Fields, 2010. The Bioelectromagnetics Society
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2008,
Kong S, Choi D, Oh H
2008 Asia-Pacific Microwave Conference, Hong Kong, China. IEEE: 1-4; ISBN 978-1-4244-2642-3