-
2022,
Cao B, He X, Lu J, Yu Z, Qi D, Li B
2022 IEEE 10th International Conference on Computer Science and Network Technology (ICCSNT), Dalian, China. IEEE: 155-157; ISBN 978-1-6654-7062-9
-
2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: 1-4; ISBN 978-1-6654-0751-9
-
2022,
Zablodskiy M, Pliuhin V, Kucheruk P
2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE: 391-396; ISBN 978-1-6654-6923-4
-
2022,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2022:16: 1-100
-
2022,
Jabłońska J, Dubrowska K, Gliźniewicz M, Paszkiewicz O, Augustyniak A, Grygorcewicz B, Konopacki M, Markowska-Szczupak A, Kordas M, Dołęgowska B, Rakoczy R
Gadd GM, Sariaslani S (eds.): Advances in Applied Microbiology. 121巻; Academic Press; 27-72; ISBN 978-0-323-98971-8
-
2022,
Bajtos M, Radil R, Janoušek L, Hargasova K, Student S, Kocikowska O
2022 23rd International Conference on Computational Problems of Electrical Engineering (CPEE), Zuberec, Slovakia. IEEE: 1-4; ISBN 9798350396263
-
Bund/Länder-Arbeitsgemeinschaft für Immissionsschutz (LAI),
1-49
-
2022,
Djuric N, Kljajic D, Gavrilov T, Markovic Golubovic N, Djuric S
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: 1-6; ISBN 978-1-6654-8363-6
-
2022,
Haider Z, Le Dréan Y, Sauleau R, Caramazza L, Liberti M, Zhadobov M
2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC), Gran Canaria, Spain. IEEE: 1-4; ISBN 978-1-6654-9986-6
-
2022,
Quirin T, Vergne C, Féry C, Badertscher P, Nicolas H, Mannhart D, Osswald S, Kuhne M, Sticherling C, Madec M, Hébrard L, Knecht S, Pascal J
2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Messina, Italy. IEEE: 1-6; ISBN 978-1-6654-8300-1