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2021,
Serrano-Díaz DG, Trujillo-Romero CJ, Vera A, Leija L
Institute of Electrical and Electronics Engineers (IEEE) (ed.): 2021 Global Medical Engineering Physics Exchanges/Pan American Health Care Exchanges (GMEPE/PAHCE), Sevilla, Spain. IEEE; 1-6; ISBN 978-1-7281-7055-8
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2021,
Mahbub F, Islam R, Akash SB, Ali MT, Islam S
2021 IEEE 12th Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), Vancouver, BC, Canada. IEEE: 1003-1009; ISBN 978-1-6654-0067-1
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2021,
Solovyev Y, Arevalo L
22nd International Symposium on High Voltage Engineering (ISH 2021), Hybrid Conference, Xi'an, China. IET: 97-101; ISBN 978-1-83953-605-2
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2021,
Afuwape OF, Kiarie WM, Bentil SA, Jiles DC
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: 1504-1507; ISBN 978-1-7281-1179-7
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2021,
Zaidi TA, Makarov SN, Fujimoto K
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: 6565-6568; ISBN 978-1-7281-1179-7
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2021 8th International Conference on Signal Processing and Integrated Networks (SPIN), Noida, India. IEEE: 98-101; ISBN 978-1-6654-0255-2
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2021,
Lamberti P, Melillo L, Kotsilkova R, Georgiev V, Tucci V, La Mura M
2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), Rome, Italy. IEEE: 335-340; ISBN 978-1-6654-2994-8
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2020,
Laurier D, Röösli M
Wild CP, Weiderpass E, Steward BW (eds.): World Cancer Report: Cancer Research for Cancer Prevention. International Agency for Research on Cancer (IARC), Lyon, France; Chapter 2.2 p.84-91; ISBN 978-92-832-0447-3
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2020,
Li H, Ren H, Qiao CC, Wang M, Zhang Z
2020 13th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI), Chengdu, China. IEEE: 619-623; ISBN 978-0-7381-0546-8
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2020,
Biagi L, Gagliardi V, Retico A, Marletta M, Aringhieri G, Tiberi G, Campanella F, Tosetti M
2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Bari, Italy. IEEE: 1-5; ISBN 978-1-7281-5387-2