Die folgenden Begriffe wurden einbezogen:
"cell proliferation", Zellproliferation, Proliferation, 細胞増殖, 増殖
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2018,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong YC
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 872-874; ISBN 978-1-5090-3955-5
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2017,
Koziorowska A, Romerowicz-Misielak M, Gierczak N, Gniady S, Koziorowski M
IEEE EUROCON 2017 -17th International Conference on Smart Technologies, Ohrid, Macedonia. IEEE: 537-541; ISBN 978-1-5090-3844-2
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2017,
Jain S, Baratchi S, Pirogova E
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE, Singapore, Singapore: 1268-1272; ISBN 978-1-5386-1211-8
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2017,
Dey S, Dey S, Ahmed AS, Mollah N
2017 3rd International Conference on Electrical Information and Communication Technology (EICT), Khulna, Bangladesh. IEEE; ISBN 978-1-5386-2308-4
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2017,
Barabáš J, Janoušek L, Radil R, Moravčíková S
2017 18th International Conference on Computational Problems of Electrical Engineering (CPEE), Kutna Hora. IEEE, Kutna Hora, Czech Republic; ISBN 978-1-5386-1040-4
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2016 8th International Conference on Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), Odessa, Ukraine. IEEE: 54-57; ISBN 978-1-5090-1580-1
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2016,
Jain S, Vojisaveljevic V, Pirogova E
2016 IEEE MTT-S International Microwave and RF Conference (IMaRC), New Delhi, India. IEEE; ISBN 978-1-5090-4686-7
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2016,
Gümüşay M, Gülbağça F, Sayğili S, Aydemir I, Kaya A, Tuğlu MI
[2016 Medical Technologies National Congress (TIPTEKNO), Antalya, Turkey]. IEEE; ISBN 978-1-5090-2387-5
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2016,
Macedo M, Wenger C, Salvador R, Fernandes SR, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5168-5171; ISBN 978-1-4577-0220-4
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2016,
Restrepo AF, Tobar VE, Camargo RJ, Franco E, Pinedo CR, Gutierrez O
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 4193-4196; ISBN 978-1-4577-0220-4