Die folgenden Begriffe wurden einbezogen:
"statisches Magnetfeld", "magnetisches Gleichfeld", Dauermagnetfeld, SMF, "static magnetic field", "DC magnetic field", 静磁界
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ASTM International,
ASTM F2182-19e2: 1-11
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN 50413 VDE 0848-1:2020-10
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2020,
Mateev V, Marinova I
2020 XI National Conference with International Participation (ELECTRONICA), Sofia, Bulgaria. IEEE: 1-5; ISBN 978-1-7281-7532-4
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2020,
Dürrenberger G, Fröhlich J, Röösli M
1-114
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2020,
Savchenko V, Synyavskiy O, Dudnyk A, Nesvidomin A, Ramsh V, Bunko V
2020 IEEE KhPI Week on Advanced Technology (KhPIWeek), Kharkiv, Ukraine. IEEE: 193-198; ISBN 978-0-7381-4241-8
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2020,
Khubieva VM, Kugusheva NN, Semenova MN
2020 International Multi-Conference on Industrial Engineering and Modern Technologies (FarEastCon), Vladivostok, Russia. IEEE: 1-6; ISBN 978-1-7281-6952-1
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019/Cor 2-2020: 1-15, ISBN 978-1-5044-7055-1
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2020,
Dergham I, Martinez Rocha JC, Imad R, Alayli Y
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-5; ISBN 978-1-7281-5580-7
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2020,
Modenese A, Gobba F
2020 IEEE International Conference on Environment and Electrical Engineering and 2020 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), Madrid, Spain. IEEE: 1-6; ISBN 978-1-7281-7456-3
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2020,
Songsiri S, Tarateeraseth V, Tanechpongtamb W
2020 17th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), Phuket, Thailand. IEEE: 283-286; ISBN 978-1-7281-6487-8
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2020,
Biagi L, Gagliardi V, Retico A, Marletta M, Aringhieri G, Tiberi G, Campanella F, Tosetti M
2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Bari, Italy. IEEE: 1-5; ISBN 978-1-7281-5387-2
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2020,
Marynchenko L, Nizhelska O, Kurylyuk A, Makara V, Naumenko S
2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE: 603-608; ISBN 978-1-7281-9714-2
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2020,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2020:04: 1-82
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2020,
Gerke M, de Ridder M, Mehnert C, Vogel E, Hoffmann M, Kurz T
Landesanstalt für Umwelt Baden-Württemberg (LUBW), Bayerisches Landesamt für Umwelt (LfU),
4. aktualisierte Auflage: 1-140
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2019,
Migahid MM, El-Bakatoushi RF, Megahed SM, Amin AW, El-Sadek LM
Proceedings of 2019 6th International Conference Bioinformatics Research and Applications (ICBRA '19), Seoul, Republic of Korea. Association for Computing Machinery, New York, NY, USA: 96-104; ISBN 978-1-4503-7218-3
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2019,
Kuznetsov K, Zakirova A
2019 International Russian Automation Conference (RusAutoCon), Sochi, Russia. IEEE: 1-5; ISBN 978-1-7281-0266-5
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN 50527-2-2 VDE 0848-527-2-2:2019-11
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Deutsche Gesetzliche Unfallversicherung (DGUV),
IFA Report, 1/2019: 1-211, ISBN 978-3-86423-237-4
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2019 19th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF), Nancy, France. IEEE: 1-2; ISBN 978-1-7281-1561-0
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2019,
Minucci S, Calabrò G, Astolfi S, Campiglia E
2019 19th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF), Nancy, France. IEEE: 1-2; ISBN 978-1-7281-1561-0
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2019 IEEE 3rd International Electrical and Energy Conference (CIEEC), Beijing, China. IEEE: 1507-1512; ISBN 978-1-7281-1676-1
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2019,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2019:08: 1-104
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2019,
Gong S, Li T, Gao C, Zhou J, Chen Z
2019 IEEE 2nd International Conference on Automation, Electronics and Electrical Engineering (AUTEEE), Shenyang, China. IEEE: 627-634; ISBN 978-1-7281-5031-4
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2019,
Wang B, Li J, Jin H, Chen X
2019 12th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI), Suzhou, China. IEEE: 1-5; ISBN 978-1-7281-4853-3
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2019,
Rathebe PC, Modisane DS, Rampedi MB, Biddesay-Manila S, Mbonane TP
2019 Open Innovations (OI), Cape Town, South Africa. IEEE: 219-221; ISBN 978-1-7281-3465-9
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2019 Open Innovations (OI), Cape Town, South Africa. IEEE: 222-225; ISBN 978-1-7281-3465-9
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2019,
Ionescu V, Săpunaru A, Popescu MO, Popescu CL
2019 IEEE PES Innovative Smart Grid Technologies Europe (ISGT-Europe), Bucharest, Romania. IEEE: 1-5; ISBN 978-1-5386-8219-7
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2019,
Bodemann R, Finke J, von Freeden J, Gritsch T, Heinrich H, Hoffmann M, Jeschke P, Joosten S, Krischek R, Reidenbach HD, Schiessl K, Schreiber M, Schühle E, Storch D, Stunder D
Fachverband für Strahlenschutz e. V. (FS),
FS-2019-180-AKNIR: 1-111
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2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: 166-169; ISBN 978-1-7281-1639-6
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Strahlenschutzkommission (SSK),
1-65
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019: 1-312, ISBN 978-1-5044-5548-0
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2019,
Petrushevskaya A, Rabin A, Kilimnik V
2019 24th Conference of Open Innovations Association (FRUCT), Moscow, Russia. IEEE: 328-334; ISBN 978-1-7281-1429-3
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2019,
Diodiu L, Popescu L
2019 8th International Conference on Modern Power Systems (MPS), Cluj Napoca, Romania. IEEE: 1-4; ISBN 978-1-7281-0751-6
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2019 Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russia. IEEE: 9-12; ISBN 978-1-5386-8365-1
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Bundesamt für Strahlenschutz (BfS),
1-90
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Internationale Organisation für Normung (ISO),
ISO/TS 10974:2018
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2018,
Hutchison ZL, Sigray P, He H, Gill AB, King J, Gibson C
Bureau of Ocean Energy Management (U.S. Department of the Interior) (BOEM),
OCS Study BOEM 2018-003: 1-254
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2018 9th International Conference on Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), Odessa, Ukraine. IEEE: 69-73; ISBN 978-1-5386-2469-2
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2018,
Della Valle E, Marracino P, Setti S, Cadossi R, Liberti M, Apollonio F
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: 1-3; ISBN 978-1-5386-3764-7
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2018,
Gurhan H, Bruzón R, Xiong Y, Barnes F
2018 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM), Boulder, CO, USA. IEEE: 1-2; ISBN 978-1-5386-5031-8
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2018,
Zhang N, Wang S, Wang S, Ning S
2018 International Applied Computational Electromagnetics Society Symposium - China (ACES), Beijing, China. IEEE: 1-2; ISBN 978-1-5386-7187-0
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2018,
Zhu T, Wang S, Zhang N, Yan Y, Guo Z, Wang S, Wang S
2018 IEEE International Conference on High Voltage Engineering and Application (ICHVE), Athens, Greece. IEEE: 1-4; ISBN 978-1-5386-5087-5
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2018,
Patwardhan R, Sonawane S, Harsh R, Gaikwad S
2018 International Conference On Advances in Communication and Computing Technology (ICACCT), Sangamner. IEEE: 616-618; ISBN 978-1-5386-0927-9
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2018,
Galante A, Alecci M, Fantasia M, Rinaldiop C, Federici F, Franchi F
2018 IEEE International Symposium on Medical Measurements and Applications (MeMeA), Rome, Italy. IEEE: 1-5; ISBN 978-1-5386-3393-9
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2018,
Sun W, He Y, Diao Y, Leung SW, Siu YM, Kong YC
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 872-874; ISBN 978-1-5090-3955-5
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2018,
Koh WJ, Moochhala SM
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 518-522; ISBN 978-1-5090-3955-5
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2018,
Malkemper EP, Tscheulin T, Vanbergen AJ, Vian A, Balian E, Goudeseune L
1-28
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2018,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2018:09: 1 - 124
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2017,
Airò M, Ala G, Buccheri P, Caruso M, Fascella G, Giovino A, Mammano MM
Beruto M, Ozudogru EA (Hrsg.): VI International Symposium on Production and Establishment of Micropropagated Plants. Acta Horticulturae, Band 1155; ISHS; 387-392; ISBN 978-94-6261-151-1
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN 50527-2-1 VDE 0848-527-2-1:2017-12