Die folgenden Begriffe wurden einbezogen:
Schein-Exposition, Schein-Befeldung, "sham exposure", 擬似ばく露
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2014,
Chen F, Qi H, Ming D, Zhou P
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: 2613-2616; ISBN 978-1-4244-7929-0
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2014,
Lv B, Su C, Yang L, Xie Y, Wu T
2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Chicago, IL, USA. IEEE: 986-989; ISBN 978-1-4244-7929-0
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2014,
Shiina T, Suzuki Y, Kasai Y, Inami Y, Taki M, Wake K
2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: 166-169; ISBN 978-4-88552-287-1
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2013,
Smitha CK, Narayanan NK
2013 Third International Conference on Advances in Computing and Communications, Cochin. IEEE: 111-114; ISBN 978-0-7695-5033-6
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Bundesamt für Strahlenschutz (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-87/13: 1-41
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2013,
Lewin G, Tillmann T, Ernst H, Kolling A, Hansen T, Müller M, Bahr A, Kellner R
Bundesamt für Strahlenschutz (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-81/13-Bd. 1: 1-102
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2012,
Kwon MK, Kim SK, Koo JM, Choi JY, Kim DW
2012 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, San Diego, CA, USA. IEEE: 2190-2193; ISBN 978-1-4577-1787-1
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2011,
Ogasawara Y, Ikehata M, Sakaguchi R, Awakura S, Yoshie S, Ohkubo C, Ishii K
2011 XXXth URSI General Assembly and Scientific Symposium, Istanbul. IEEE: 12340344; ISBN 978-1-4244-5117-3
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2011,
Nam KC, Choi JL, Kwon MK, Jang KH, Kim DW
2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Boston, MA, USA. IEEE: 1925-1928; ISBN 978-1-4577-1589-1
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2011,
Kwon MK, Nam KC, Lee da S, Jang KH, Kim DW
2011 Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Boston, MA, USA. IEEE: 1961-1964; ISBN 978-1-4577-1589-1