キーワード:
比吸収率, "Spezifische Absorptionsrate", SAR, "specific energy absorption rate", "specific absorption rate", 比エネルギー吸収率
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2009,
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Health Phys 52 (1): 39-43
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1986,
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Radiat Res 108 (3): 260-268
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Health Phys 46 (2): 315-320
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1983,
McRee DI, Thaxton JP, Parkhurst CR
Radiat Res 96 (1): 51-58
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1982,
McRee DI, Wachtel H
Radiat Res 91 (1): 212-218
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1981,
McRee DI, MacNichols G
Radiat Res 85 (2): 340-348
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1980,
McRee DI, Wachtel H
Radiat Res 82 (3): 536-546
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1979,
McRee DI, Wachtel H
Radio Sci 14 (6) Suppl: 75 - 79
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1992,
Mechling JA, Strohbehn JW
Int J Hyperthermia 8 (4): 529-542
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2014,
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Electromagn Biol Med 33 (2): 81-91
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2022,
Meenu L, Aiswarya S, Menon SK, Menon KU
2022 URSI Regional Conference on Radio Science (USRI-RCRS), Indore, India. IEEE: 1-4; ISBN 978-1-6654-5359-2
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2022,
Meenu L, Aiswarya S, Menon SK
Electromagn Biol Med 41 (2): 184-200
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2017,
Meenu L, Aiswarya S, Menon SK
2017 IEEE International Conference on Smart Technologies and Management for Computing, Communication, Controls, Energy and Materials (ICSTM), Chennai, India. IEEE: 299-303; ISBN 978-1-5090-5906-5
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2015,
Megha K, Deshmukh PS, Banerjee BD, Tripathi AK, Ahmed R, Abegaonkar MP
Neurotoxicology 51: 158-165
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2015,
Megha K, Deshmukh PS, Ravi AK, Tripathi AK, Abegaonkar MP, Banerjee BD
Cell Biochem Biophys 73 (1): 93-100
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2012,
Megha K, Deshmukh PS, Banerjee BD, Tripathi AK, Abegaonkar MP
Indian J Exp Biol 50 (12): 889-896
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2019,
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Magn Reson Med 81 (3): 2106-2119
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2018,
Mellita RA, Chandu DS, Karthikeyan SS
2018 International Conference on Signal Processing and Communications (SPCOM), Bangalore, India. IEEE: 110-114; ISBN 978-1-5386-3822-4
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1990,
Meltz ML, Eagan P, Erwin DN
Bioelectromagnetics 11 (2): 149-157
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1989,
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1988,
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Physiol Chem Phys Med NMR 20 (1): 23-30
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1987,
Meltz ML, Walker KA, Erwin DN
Radiat Res 110 (2): 255-266
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IEEE Access 6: 12940-12944
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2018,
Mengjun W, Jun Z, Hongxing Z, Mengjun W, Lulu C, Ze Y, Ping M, Hongxing Z
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 981-985; ISBN 978-1-5090-3955-5