-
2014,
Capozzella A, Sacco C, Chighine A, Loreti B, Scala B, Casale T, Sinibaldi F, Tomei G, Giubilati R, Tomei F, Rosati MV
Ann Ig 26 (5): 456-472
-
2014,
Sorahan T, Mohammed N
Occup Med 64 (6): 454-460
-
2014,
Bunch KJ, Keegan TJ, Swanson J, Vincent TJ, Murphy MF
Br J Cancer 110 (5): 1402-1408
-
J Phys Chem B 118 (18): 4963-4969
-
Occup Med 64 (3): 150-156
-
Occup Med 64 (3): 157-165
-
2014,
Lagorio S, Röösli M
Bioelectromagnetics 35 (2): 79-90
-
2014,
Benson VS, Pirie K, Schüz J, Reeves GK, Beral V, Green J
Int J Epidemiol 43 (1): 275
-
Int J Epidemiol 43 (1): 273-274
-
Future Oncol 9 (5): 657-667
-
2013,
Shiozawa P, da Silva ME, Raza R, Uchida RR, Cordeiro Q, Fregni F, Brunoni AR
J ECT 29 (2): 147-148
-
2013,
Li S, Yu B, Zhou D, He C, Zhuo Q, Hulme JM
Cochrane Database Syst Rev 12: CD003523
-
2013,
Wang Q, Cao Z, Qu Y, Peng X, Guo S, Chen L
PLoS One 8 (12): e82113
-
2013,
Ryang We S, Koog YH, Jeong KI, Wi H
Rheumatology 52 (5): 815-824
-
2013,
Jimenez Lozano JN, Vacas-Jacques P, Anderson RR, Franco W
Lasers Surg Med 45 (5): 326-338
-
2013,
Havas M, Marrongelle J
Electromagn Biol Med 32 (2): 253-266
-
2013,
Parazzini M, Ravazzani P, Thuroczy G, Molnar FB, Ardesi G, Sacchettini A, Mainardi LT
Electromagn Biol Med 32 (2): 173-181
-
2013,
Benson VS, Pirie K, Schüz J, Reeves GK, Beral V, Green J
Int J Epidemiol 42 (3): 792-802
-
2013,
Semenov KT, Aslanian RR
Biofizika 58 (1): 70-74
-
2013,
Bertolino G, Dutra Souza HC, de Araujo JE
Electromagn Biol Med 32 (4): 527-535
-
2013,
Bertolino G, de Araujo FL, de Souza HC, Coimbra NC, de Araujo JE
Int J Radiat Biol 89 (8): 595-601
-
2013,
Gomez G, Duran-Sindreu F, Jara Clemente F, Garofalo RR, Garcia M, Bueno R, Roig M
Int Endod J 46 (5): 399-405
-
2013,
Vergara X, Kheifets L, Greenland S, Oksuzyan S, Cho YS, Mezei G
J Occup Environ Med 55 (2): 135-146
-
2013,
Redmayne M, Smith E, Abramson MJ
J Expo Sci Environ Epidemiol 23 (5): 539-544
-
2012,
Adochiei NI, Dorffner G, David V
2012 International Conference and Exposition on Electrical and Power Engineering, Iasi, Romania. IEEE; ISBN 978-1-4673-1173-1