この研究は、無処置および化学的ストレスを与えたPC12細胞に対する50Hzの超低周波電磁界(ELF-EMF:最大1000μT)の急性ばく露(30分間)および亜慢性ばく露(48時間)の影響を調べた。化学的ストレスを与えたPC12細胞では鉄および活性酸素種(ROS)のレベルが高くなり、外界からの刺激の影響を受けやすくなっている。その結果、無処置PC12の急性ばく露で細胞内カルシウムイオン動態は変化せず、亜慢性ばく露でも一貫した変化は見られず、ROS産生および膜の完全性も影響を受けなかった;化学的ストレスを与えたPC12細胞では、急性および亜慢性ばく露のいずれにおいても、細胞内カルシウムイオン動態、ROS産生、膜の完全性に一貫した変化は生じなかった、報告している。
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To investigate the potential neurotoxic effects of acute (30 minutes) and sub-chronic (48 hours) exposure to extremely low frequency magnetic fields alone or in combination with chemical stress on PC-12 cells.
Cells were chemically stressed with 5 µM dexamethasone (a glucocorticoid, for 3-5 days), 100 µM L-DOPA (L-3,4-dihydroxyphenylalanine, for 24 hours), 10 µM FeSO4 (iron sulfate, for 24 hours) or left naive (without chemical stress) prior to magnetic field exposure.
周波数 | 50 Hz |
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タイプ |
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ばく露時間 | 30 minutes |
Additional information | acute exposure |
ばく露の発生源/構造 | |
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ばく露装置の詳細 | copper coil fitted to the stage of the fluorescence microscope; exposure device consisted of double copper wired solenoid coils connected to a signal generator; copper coils consisted of one continuous copper conductor, ensuring equal current in different coil components |
Sham exposure | A sham exposure was conducted. |
周波数 | 50 Hz |
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タイプ |
|
ばく露時間 | 48 hours |
Additional information | sub-chronic exposure |
ばく露の発生源/構造 | |
---|---|
ばく露装置の詳細 | copper coil fitted into an incubator; exposure device consisted of double copper wired solenoid coils connected to a signal generator; copper coils consisted of one continuous copper conductor, ensuring equal current in different coil components |
Sham exposure | A sham exposure was conducted. |
No significant differences were observed between exposed (acute and sub-chronic) and sham exposed cells independent if cells were chemically stressed.
The results indicate that acute and sub-chronic exposure to extremely low frequency magnetic fields do not induce neurotoxic effects neither in naive nor in chemically stressed PC-12 cells.
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