Die folgenden Begriffe wurden einbezogen:
microwaves, Mikrowellen, MW, マイクロ波
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1988,
Valdagni R, Amichetti M, Cristoforetti L
Int J Hyperthermia 4 (5): 457-466
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1988,
Strohmaier WL, Bichler KH, Kiefer M, Lev A
Helv Chir Acta 55 (3): 301-303
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1988,
Hjeresen DL, Francendese A, O'Donnell JM
Bioelectromagnetics 9 (1): 63-78
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1988,
Liu YH, Liu ZQ, Wang YQ, Li HB, Fang BR
J Bioelectricity 7 (1): 97-102
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1988,
Yee KC, Chou CK, Guy AW
Bioelectromagnetics 9 (2): 175-181
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1988,
Marani E, Bolhuis P, Boon ME
Histochem J 20 (6-7): 397-404
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1988,
Saunders RD, Kowalczuk CI, Beechey CV, Dunford R
Int J Radiat Biol Relat Stud Phys Chem Med 53 (6): 983-992
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1988,
Santini R, Hosni M, Deschaux P, Pacheco H
Bioelectromagnetics 9 (1): 105-107
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1988,
Steel MC, Sheppard RJ
Phys Med Biol 33 (4): 467-472
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1988,
Byus CV, Kartun K, Pieper S, Adey WR
Cancer Res 48 (15): 4222-4226
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1988,
International Non-ionizing Radiation Committee of the International Radiation Protection Association (IRPA/INIRC)
Health Phys 54 (1): 115-123
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1988,
Browning MD, Haycock JW
Neurotoxicol Teratol 10 (5): 461-464
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Bioelectromagnetics 9 (4): 337-345
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1988,
Lai H, Horita A, Guy AW
Bioelectromagnetics 9 (4): 355-362
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1988,
Lin JC, Su JL, Wang Y
Bioelectromagnetics 9 (2): 141-147
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1988,
Bogolyubov VM, Zubkova SM, Frenkel ID, Sokolova ZA, Laprun IB
Radiat Res 115 (1): 44-53
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1988,
Liburdy RP, Rowe AW, Vanek Jr PF
Radiat Res 114 (3): 500-514
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1988,
Brayman AA, Miller MW
Radiat Environ Biophys 27 (3): 239-243
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Neurochem Res 13 (7): 671-677
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1988,
Philippova TM, Novoselov VI, Bystrova MF, Alekseev SI
Bioelectromagnetics 9 (4): 347-354
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Bioelectromagnetics 9 (3): 249-257
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1988,
D'Inzeo G, Bernardi P, Eusebi F, Grassi F, Tamburello C, Zani BM
Bioelectromagnetics 9 (4): 363-372
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1988,
Mitchell CL, McRee DI, Peterson NJ, Tilson HA
Bioelectromagnetics 9 (3): 259-268
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7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: S. 239-244; ISBN 978-1-5090-3192-4
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7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: S. 233-238; ISBN 978-1-5090-3192-4